Thermal stability and thermoelectric properties of Mg2Si 0.4Sn0.6 and Mg2Si0.6Sn 0.4

Journal of Materials Science

Volumn 48, Issue 5, 2013, Pages 2002-2008

  Søndergaard, Martin ^a   Christensen, Mogens ^a   Borup, Kasper A ^a   Yin, Hao ^a   Iversen, Bo B ^a  

^a AARHUS UNIVERSITY   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

ENVIRONMENTALLY-FRIENDLY; HALL CARRIER CONCENTRATIONS; POWDER DIFFRACTION; POWDER X RAY DIFFRACTION; TEMPERATURE RANGE; THERMAL EXPANSION COEFFICIENTS; THERMO-ELECTRIC MATERIALS; THERMOELECTRIC PROPERTIES;

BALL MILLING; ENERGY CONVERSION; PELLETIZING; SILICON; SPARK PLASMA SINTERING; THERMAL CONDUCTIVITY; THERMAL EXPANSION; THERMODYNAMIC STABILITY; THERMOELECTRIC EQUIPMENT; THERMOELECTRICITY; X RAY DIFFRACTION;

TIN;

EID: 84880698868     PISSN: 00222461     EISSN: 15734803     Source Type: Journal    
DOI: 10.1007/s10853-012-6967-0     Document Type: Article

References (22)

1. Zaitsev VK, Fedorov MI, Gurieva EA, Eremin IS, Konstantinov PP, Samunin AY, Vedernikov MV (2006) Phys Rev B 74:045207
2. Zaitsev VK, Fedorov MI, Eremin IS, Gurieva EA (2006) In: Rowe DM (ed) Thermoelectric handbook, macro to nano. CRC Taylor & Francis, Boca Raton, p 29
3. Isoda Y, Nagai T, Fujiu H, Imai Y, Shinohara Y (2007) In: 26th International Conference on Thermoelectrics (ICT 2007), p 251
4. Gao H, Zhu T, Liu X, Chen L, Zhao X (2011) J Mater Chem 21:5933
5. Rowe DM (2006) Thermoelectrics handbook: macro to nano. CRC/Taylor & Francis, Boca Raton
6. Snyder GJ, Toberer ES (2008) Nat Mater 7:105
7. Vineis CJ, Shakouri A, Majumdar A, Kanatzidis MG (2010) Adv Mater 22:3970
8. Liu W, Tan X, Yin K, Liu H, Tang X, Shi J, Zhang Q, Uher C (2012) Phys Rev Lett 108:166601
9. Liu W, Tang X, Li H, Sharp J, Zhou X, Uher C (2011) Chem Mater 23:5256
10. Zhang Q, He J, Zhu TJ, Zhang SN, Zhao XB, Tritt TM (2008) Appl Phys Lett 93:102109
11. Zaitsev VK, Fedorov MI, Gurieva EA, Eremin IS, Konstantinov PP, Samunin AY, Vedernikov MV (2005) In: 24th International Conference on Thermoelectrics (ICT) (IEEE Cat. No. 05TH8854C)
12. Jung I-H, Kang D-H, Park W-J, Kim NJ, Ahn S (2007) Calphad 31:192
13. Sondergaard M, Christensen M, Borup KA, Yin H, Iversen BB (2012) Acta Mater 60:5745
14. Søndergaard M, Christensen M, Borup KA, Yin H, Iversen BB (2012) J Electron Mater
15. Adachi S, Oguchi T, Tanida H, Park SY, Shimizu H, Miyatake H, Kamiya N, Shiro Y, Inoue Y, Ueki T, Iizuka T (2001) Nucl Instrum Method A Part 1 711:467-468
16. Rodriguezcarvajal J (1993) Phys B 192:55
17. van der Pauw LJ (1958) Philips Res Rep 13:1-9
18. Borup KA, Toberer ES, Fleurial JP, Snyder GJ, Iversen BB (2012) Rev Sci Instrum (submitted)
19. Iwanaga S, Toberer ES, LaLonde A, Snyder GJ (2011) Rev Sci Instrum 82:063905
20. Boudemagh D, Fruchart D, Haettel R, Hlil EK, Lacoste A, Ortega L, Skryabina N, Tobola J, Wolfers P (2011) Diffus Defect B 170:253
21. Fistul VI (1969) Heavily doped semiconductors. Plenum Press, New York
22. Fedorov MI, Zaitsev VK, Vedernikov MV (2006) In: 25th International Conference on Thermoelectrics (IEEE Cat No. 06TH8931C)