Transmission electron microscopy study of degradation in transparent indium tin oxide/Ag/indium tin oxide multilayer films

Applied Physics Letters

Volumn 103, Issue 1, 2013, Pages

  Jeong, Jin A ^a   Kim, Han Ki ^a   Koo, Hyun Woo ^b   Kim, Tae Woong ^b  

^a Kyung Hee University   (South Korea)

^b Samsung Advanced Institute of Technology (SAIT)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION MECHANISM; HIGH TRANSMITTANCE; INDIUM TIN OXIDE; INTERFACE REGIONS; OPTICAL DEGRADATION; RAPID THERMAL ANNEALING (RTA); STRUCTURAL EVOLUTION; SYNCHROTRON X-RAY SCATTERING;

DEGRADATION; GRAIN BOUNDARIES; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MULTILAYER FILMS; MULTILAYERS; OPTICAL MULTILAYERS; RAPID THERMAL ANNEALING; SCATTERING; SILVER; TIN;

TIN OXIDES;

EID: 84880314451     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4812815     Document Type: Article

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