Nanoscale transistors - Just around the gate?

Science

Volumn 341, Issue 6142, 2013, Pages 140-141

  Cress, Cory D ^a   Datta, Suman ^b  

^a NAVAL RESEARCH LABORATORY   (United States)

^b The Pennsylvania State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

NANOWIRE; SINGLE WALLED NANOTUBE;

ELECTRODE; GEOMETRY; LEAKAGE; PERFORMANCE ASSESSMENT; SIZE;

CHIRALITY; COLUMN CHROMATOGRAPHY; CRYSTALLIZATION; ELECTRIC POTENTIAL; ELECTRODE; ELECTRON; GEOMETRY; LOW TEMPERATURE; MOLECULAR ELECTRONICS; NANOENGINEERING; PRIORITY JOURNAL; SEMICONDUCTOR; SHORT SURVEY; ULTRACENTRIFUGATION;

EID: 84880262935     PISSN: 00368075     EISSN: 10959203     Source Type: Journal    
DOI: 10.1126/science.1240452     Document Type: Short Survey

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