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Volumn 13, Issue 7, 2013, Pages 3152-3156

Erratum: Single defect center scanning near-field optical microscopy on graphene (Nano Letters (2013) 13:7 (3152-3156) DOI: 10.1021/nl401129m);Single defect center scanning near-field optical microscopy on graphene

Author keywords

FRET; graphene; nanodiamond; nitrogen vacancy center; Scanning near field optical microscopy; scanning probe

Indexed keywords

ENERGY TRANSFER; FORSTER RESONANCE ENERGY TRANSFER; GRAPHENE; MOLECULES; NANODIAMONDS; OPTICAL DATA STORAGE; SCANNING;

EID: 84880172617     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl402495a     Document Type: Erratum
Times cited : (111)

References (31)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.