High-precision alignment of electron tomography tilt series using markers formed in helium-ion microscope

Micron

Volumn 50, Issue , 2013, Pages 29-34

  Hayashida, M ^a   Iijima, T ^b   Tsukahara, M ^b   Ogawa, S ^b  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Alignment precision; Electron tomography; Fiducial marker; Helium ion microscopy; Tilt series; Transmission electron microscope

Indexed keywords

DEGREE OF PRECISION; ELECTRON TOMOGRAPHY; FIDUCIAL MARKER; GAS INJECTION SYSTEM; PRECISE ALIGNMENTS; THREE-DIMENSIONAL (3D) IMAGE; TILT SERIES; TRANSMISSION ELECTRON MICROSCOPE;

ELECTRIC IMPEDANCE TOMOGRAPHY; HELIUM; ION MICROSCOPES; TEMPLATE MATCHING; THREE DIMENSIONAL; TRANSMISSION ELECTRON MICROSCOPY;

ALIGNMENT;

EID: 84880135109     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2013.04.002     Document Type: Article

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