Estimation and modeling of the full well capacity in pinned photodiode CMOS image sensors

IEEE Electron Device Letters

Volumn 34, Issue 7, 2013, Pages 900-902

  Pelamatti, Alice ^a   Goiffon, Vincent ^a   Estribeau, Magali ^a   Cervantes, Paola ^a   Magnan, Pierre ^a  

^a UNIVERSITÉ DE TOULOUSE   (France)

Author keywords

Active pixel sensor (APS); charge transfer; CMOS Image Sensors (CIS); full well capacity; pinned photodiode (PPD); pinning voltage; semiconductor device modeling

Indexed keywords

ACTIVE PIXEL SENSOR; CMOS IMAGE SENSOR; FULL WELL CAPACITY; HANDLING CAPABILITY; OPERATING CONDITION; PHOTON FLUX; PINNED PHOTODIODES; TECHNICAL DOCUMENTATIONS;

CHARGE TRANSFER; DIGITAL CAMERAS; PHOTODIODES; SEMICONDUCTOR DEVICE MODELS;

PIXELS;

EID: 84880076541     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2013.2260523     Document Type: Article

References (7)

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