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Volumn 52, Issue 18, 2013, Pages 4279-4286

Inspection of freeform intraocular lens topography by phase measuring deflectometric methods

Author keywords

[No Author keywords available]

Indexed keywords

PHASE MEASUREMENT; SURFACE DEFECTS; SURFACE MEASUREMENT; SURFACE TOPOGRAPHY; TOPOGRAPHY;

EID: 84879925923     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.52.004279     Document Type: Article
Times cited : (19)

References (29)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.