Deflectometry Rivals Interferometry;Deflektometrie macht der Interferometrie Konkurrenz

Technisches Messen

Volumn 76, Issue 4, 2009, Pages 175-181

  Knauer, Markus C ^a   Richter, Claus ^a,b   Hýbl, Ondřej ^a,b   Kaminski, Jürgen ^a,b   Faber, Christian ^a,b   Häusler, Gerd ^a,b  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

^b Universität Erlangen Nürnberg ^*

Author keywords

Deflectometry; Free form surface; Optical measuring technique; Specular surface; Surface measurement

Indexed keywords

DEFLECTOMETRY; FREE-FORM SURFACE; HEIGHT VARIATION; NANO-METER REGIMES; OPTICAL MEASURING TECHNIQUES; PHYSICAL LIMITS; SPECULAR SURFACE; THEORETICAL ASPECTS;

INSTRUMENTS; MEASUREMENTS;

SURFACE MEASUREMENT;

EID: 67649922547     PISSN: 01718096     EISSN: None     Source Type: Journal    
DOI: 10.1524/teme.2009.0933     Document Type: Article

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