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Volumn 19, Issue 4, 2010, Pages
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Analysis of processes responsible for the memory effect in air at low pressures
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMS;
COSMOLOGY;
IONS;
MOLECULES;
DE-EXCITATIONS;
LOW PRESSURES;
MEMORY EFFECTS;
METASTABLE MOLECULES;
NET EFFECT;
NITROGEN IONS;
POST-DISCHARGE;
SMALL CONCENTRATION;
NITROGEN;
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EID: 84879922161
PISSN: 09630252
EISSN: 13616595
Source Type: Journal
DOI: 10.1088/0963-0252/19/4/045021 Document Type: Article |
Times cited : (22)
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References (79)
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