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Volumn 33, Issue 21, 2000, Pages 2786-2790
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Analysis of mechanisms which lead to electrical breakdown in a krypton-filled tube using the time delay method
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC BREAKDOWN;
ELECTRIC DISCHARGES;
GAMMA RAYS;
KRYPTON;
POSITIVE IONS;
TIME DELAY METHODS;
ELECTRON TUBES;
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EID: 0034321389
PISSN: 00223727
EISSN: None
Source Type: Journal
DOI: 10.1088/0022-3727/33/21/318 Document Type: Article |
Times cited : (25)
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References (22)
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