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Volumn 33, Issue 21, 2000, Pages 2786-2790

Analysis of mechanisms which lead to electrical breakdown in a krypton-filled tube using the time delay method

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC BREAKDOWN; ELECTRIC DISCHARGES; GAMMA RAYS; KRYPTON; POSITIVE IONS;

EID: 0034321389     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/33/21/318     Document Type: Article
Times cited : (25)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.