Structural and optical properties of Ag-doped copper oxide thin films on polyethylene napthalate substrate prepared by low temperature microwave annealing

Journal of Applied Physics

Volumn 113, Issue 24, 2013, Pages

  Das, Sayantan ^a,b   Alford, T L ^a,b  

^a ARIZONA STATE UNIVERSITY   (United States)

^b Arizona State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LOW TEMPERATURE MICROWAVES; LOW TEMPERATURE PROCESSING; LOW TEMPERATURE TOLERANCE; MICRO-STRUCTURAL PROPERTIES; POLYETHYLENE NAPHTHALATE; POLYETHYLENE NAPTHALATE; RUTHERFORD BACK-SCATTERING SPECTROMETRY; STRUCTURAL AND OPTICAL PROPERTIES;

ATOMIC FORCE MICROSCOPY; ENERGY GAP; FILM PREPARATION; MICROWAVE HEATING; OPTICAL PROPERTIES; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SUBSTRATES; TEMPERATURE; THIN FILMS; X RAY DIFFRACTION;

SILVER;

EID: 84879861071     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4812584     Document Type: Article

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