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Volumn 7, Issue 6, 2013, Pages 5058-5063

Atomic-scale identification of individual lanthanide dopants in optical glass fiber

Author keywords

amorphous; atomic resolution STEM; dopant; optical glass fiber

Indexed keywords

ABERRATION-CORRECTED; ABERRATION-CORRECTED SCANNING TRANSMISSION ELECTRON MICROSCOPIES; AMORPHOUS GLASS; ATOMIC RESOLUTION; HIGH-ANGLE ANNULAR DARK FIELDS; IDENTIFICATION OF INDIVIDUALS; IMAGE SIMULATIONS; SPECIMEN THICKNESS;

EID: 84879644568     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn400605z     Document Type: Article
Times cited : (25)

References (12)
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    • 0024263925 scopus 로고
    • Chemically Sensitive Structure-Imaging with a Scanning-Transmission Electron-Microscope
    • Pennycook, S. J.; Boatner, L. A. Chemically Sensitive Structure-Imaging with a Scanning-Transmission Electron-Microscope Nature 1988, 336, 565-567
    • (1988) Nature , vol.336 , pp. 565-567
    • Pennycook, S.J.1    Boatner, L.A.2
  • 8
    • 1942455803 scopus 로고    scopus 로고
    • Observation of Rare-Earth Segregation in Silicon Nitride Ceramics at Subnanometre Dimensions
    • Shibata, N.; Pennycook, S. J.; Gosnell, T. R.; Painter, G. S.; Shelton, W. A.; Becher, P. F. Observation of Rare-Earth Segregation in Silicon Nitride Ceramics at Subnanometre Dimensions Nature 2004, 428, 730-733
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    • Shibata, N.1    Pennycook, S.J.2    Gosnell, T.R.3    Painter, G.S.4    Shelton, W.A.5    Becher, P.F.6
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    • Three-Dimensional ADF Imaging of Individual Atoms by Through-focal Series Scanning Transmission Electron Microscopy
    • van Benthem, K.; Lupini, A. R.; Oxley, M. P.; Findlay, S. D.; Allen, L. J.; Pennycook, S. J. Three-Dimensional ADF Imaging of Individual Atoms by Through-focal Series Scanning Transmission Electron Microscopy Ultramicroscopy 2006, 106, 1062-1068
    • (2006) Ultramicroscopy , vol.106 , pp. 1062-1068
    • Van Benthem, K.1    Lupini, A.R.2    Oxley, M.P.3    Findlay, S.D.4    Allen, L.J.5    Pennycook, S.J.6
  • 12
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    • Quantitative Atomic Resolution Scanning Transmission Electron Microscopy
    • LeBeau, J. M.; Findlay, S. D.; Allen, L. J.; Stemmer, S. Quantitative Atomic Resolution Scanning Transmission Electron Microscopy Phys. Rev. Lett. 2008, 100 Technology Technology Technology
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.