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1
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0035162027
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Total dose and single event effects testing of the intel pentium EI (P3) and AMD K7 microprocessors
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IEEE NSREC 2001, Data Workshop
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Single-event upset in commercial silicon-on-insolator powerPC microprocessors
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Single event functional interrupt (SEFI) sensitivity in microcircuits
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Cannes, France
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R. Koga et al., "Single Event Functional Interrupt (SEFI) Sensitivity in Microcircuits", Proceedings of the 1997 RADECS Conference, p. 311, Cannes, France
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Koga, R.1
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4
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SEE tests for commercial off-The-shelf DSPs to be used in a space experiment
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M. Menichelli et al, "SEE Tests for Commercial Off-the-Shelf DSPs to be Used in a Space Experiment", IEEE NSREC 2002 Conference, July 2002
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IEEE NSREC 2002 Conference
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5
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84879401004
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Technology/product offerings and QML status of BAE systems in manassas VA
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April 17
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BAE Systems Presentation, Space Parts Working Group Proceedings
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7
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84879374931
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Reliable and radiation hardened by design (RHBD) components for space
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R. Lacoe, D. Mayer & E. King, "Reliable and Radiation Hardened by Design (RHBD) Components for Space", Aerospace Corporation Presentation, RHBD Workshop, Los Angeles, CA, August 6, 2002.
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Aerospace Corporation Presentation, RHBD Workshop
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Lacoe, R.1
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8
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84879335368
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Honeywell SSEC website
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"Honeywell's SOI-IV Datasheet", Honeywell SSEC website www.ssec.honeywell.com
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Honeywell's SOI-IV Datasheet
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9
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84879335368
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Honeywell SSEC website
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"Honeywell's SOI-V Datasheet", Honeywell SSEC website vvu w.ssec.honevwell.com
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Honeywell's SOI-V Datasheet
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11
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84879356736
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Maxwell's SB486R Datasheet, Maxwell website
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"Maxwell's SB486R Datasheet", Maxwell website www.maxwell.com
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13
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4244047387
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Nahmsuk Oh, Technical Report number CRC-TR-00-9, Center for Reliable Computing, December
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Software Implemented Hardware Fault Tolerance
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14
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4244007897
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Philip Shirvani, Technical Report number 01-6, Center for Reliable Computing, June
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"Fault-Tolerant Computing for Radiation Environments", Philip Shirvani, Technical Report number 01-6, Center for Reliable Computing, June, 2001
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Fault-Tolerant Computing for Radiation Environments
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15
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84879393494
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Aerospace Publication, Feb. 4
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R. Lacoe, J. Osborn, R Koga, S. Brown and D. Mayer, "Application of Hardness-by-Design Methodology to Radiation-Tolerant ASIC Technologies", Aerospace Publication, Feb. 4, 2000
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Application of Hardness-by-Design Methodology to Radiation-Tolerant ASIC Technologies
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Lacoe, R.1
Osborn, J.2
Koga, R.3
Brown, S.4
Mayer, D.5
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17
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84879332657
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Soft error rate mitigation techniques for modern microcircuits
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Dec.
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D. Mavis and P. Eaton, "Soft Error Rate Mitigation Techniques for Modern Microcircuits", IEEE Tranactions Nuclear Science, Dec. 2001
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IEEE Tranactions Nuclear Science
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Mavis, D.1
Eaton, P.2
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19
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84879388923
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Radiation characterization, and SEU mitigation, of the virtex FPGA for space-based reconfigurable computing
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Proceedings MAPLD Conference
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Fuller, E.1
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20
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84879379255
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Proton testing of SEU mitigation methods for the virtex FPGA
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September
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"Proton Testing of SEU Mitigation Methods for the Virtex FPGA", C. Carmichale (et al), RADECS Conference, September 2001
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(2001)
RADECS Conference
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Carmichale, C.1
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21
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0028712340
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SEU hardening of field programmable gate arrays for space applications and device characterization
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July
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IEEE Transactions on Nuclear Science
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Katz, R.1
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22
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84879363043
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Space qualification of hardened by design ASICs
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"Space Qualification of Hardened by Design ASICs", D. Alexander, Presentation at MRQ Workshop, Dec. 11,2001
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Alexander, D.1
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