A novel fault diagnosis approach based on environmental stress level evaluation

Proceedings of the Institution of Mechanical Engineers, Part G: Journal of Aerospace Engineering

Volumn 227, Issue 5, 2013, Pages 816-826

  Deng, Guanqian ^a   Qiu, Jing ^a   Liu, Guanjun ^a   Lv, Kehong ^a  

^a NATIONAL UNIVERSITY OF DEFENSE TECHNOLOGY   (China)

Author keywords

Diagnosability; Discrete event systems; Environmental stress; Intermittent faults; Interval grey relational degree; Permanent faults

Indexed keywords

DIAGNOSABILITY; ENVIRONMENTAL STRESS; GREY RELATIONAL DEGREE; INTERMITTENT FAULT; PERMANENT FAULTS;

DISCRETE EVENT SIMULATION; ELECTRIC FAULT CURRENTS;

FAULT DETECTION;

EID: 84879284942     PISSN: 09544100     EISSN: 20413025     Source Type: Journal    
DOI: 10.1177/0954410012442857     Document Type: Conference Paper

References (33)

1. Zbytniewski J and Cooper C. CNDs and RTOKs: are we addressing these problems correctly? In: Proceedings of the 1994 national aerospace and electronics conference, Dayton, OH, USA, May 1994, pp.402-410.
2. Westervelt K. F/A-18D (RC) built-in-test false alarms. In: Proceedings of aerospace conference, Big Sky, MT, USA, 2002, pp.2961-2970.
3. Byington CS and Begin M. False alarm mitigation of vibration diagnostic systems. In: Proceedings of aerospace conference, Big Sky, MT, USA, 2008, pp.1-11.
4. Sorensen BA, Kelly G, Sajecki A, et al. An analyzer for detecting intermittent faults in electronic devices. In: IEEE systems readiness technology conference, 2001, pp.1-12.
5. Steadman B, Berghout F and Olsen N. Intermittent fault detection and isolation system. In: IEEE AUTOTESTCON conference, 2008, pp.37-40.
6. Shahin HZ, Raymond HK and Wonham WM. Fault diagnosis in discrete-event systems: framework and model reduction. IEEE Trans Automat Contr 2003; 48(7): 1199-1212.
7. Sampath M, Sengupta R, Lafortune S, et al. Diagnosability of discrete event systems. IEEE Trans Automat Contr 1995; 40(9): 1555-1575.
8. Sampath M and Lafortune S. Active diagnosis of discrete event systems. IEEE Trans Automat Contr 1998; 43(7): 908-929. (Pubitemid 128737720)
9. Jiang SZ, Huang VC and Kumar R. A polynomial time algorithm for diagnosability of discrete event systems. IEEE Trans Automat Contr 2001; 46(8): 1318-1321. (Pubitemid 32829763)
10. Lin F. Diagnosability of discrete event systems and its applications. Discr Event Dynam Syst: Theory Appl 1994; 4(1): 197-212.
11. Boel RK and van Schuppen JH. Decentralized failure diagnosis for discrete-event systems with constrained communication between diagnosers. In: Proceedings of international workshop on discrete event systems, Zaragoza, Spain, 2002, pp.175-181.
12. Debouk, R., Lafortune, S., and Teneketzis, D. Coordinated decentralized protocols for failure diagnosis of discrete event systems. Discr Event Dynam Syst: Theory Appl 2000; 10: 33-79.
13. Ricker SL and van Schuppen JH. Decentralized failure diagnosis with asynchronous communication between supervisors. In: Proceedings of the European control conference, Porto, Portugal, 2001, pp.1002-1006.
14. Sengupta R and Tripakis S. Decentralized diagnosis of regular language is undecidable. In: Proceedings of IEEE conference on decision and control, Las Vegas, NV, USA, December 2002, pp.423-428.
15. Su R, Wonham WM, Kurien J, et al. Distributed diagnosis for qualitative systems. In: Proceedings of international workshop on discrete event systems, Zaragoza, Spain, 2002, pp.169-174.
16. Contant O, Lafortune S and Teneketzis D. Diagnosis of intermittent failures. Discr Event Dynam Syst: Theory Appl 2004; 14(2): 171-202.
17. Jiang SB and Kumar R. Failure diagnosis of discrete event systems with linear-time temporal logic fault specifications. In: Proceedings of American control conference, Anchorage, AK, USA, 2002, pp.128-133.
18. Jiang SB, Kumar R and Garcia HE. Diagnosis of repeated/intermittent failures in discrete event systems. IEEE Trans Robot Automat 2003; 19(2): 310-323.
19. Abreu R, Zoeteweij P and van Gemund AJC. A new Bayesian approach to multiple intermittent fault diagnosis. In: 21st international joint conference on artificial intelligence, Pasadena, California, USA, 2009, pp.653-658.
20. de Kleer J. Diagnosing multiple persistent and intermittent faults. In: 21st international joint conference on artificial intelligence, Barcelona, Catalona, Spain, 2009, pp.733-738.
21. Correcher A, Garci'a E, Morant F, et al. Diagnosis of intermittent fault dynamics. In: IEEE international conference on emerging technologies and factory automation, Hamburg, Germany, 2008, pp.559-566.
22. Bondavalli A, Chiaradonna S, Giandomenico FD, et al. Threshold-based mechanisms to discriminate transient from intermittent faults. IEEE Trans Comput 2000; 49(3): 230-245.
23. Harvey G, Louis S and Buska S. Micro-time stress measurement device development. RL-TR-94-196, 1994.
24. Broadwater SP, Oblak TA and Popyack LJ. Maintenance processor/time stress measurement device (MP/TSMD) use for failure trend analysis. In: IEEE proceedings annual reliability and maintainability symposium, 1992, pp.228-238.
25. Dale WR and James AC. Intelligent built-in test and stress measure. In: IEEE automatic testing conference, 1989, pp.261-266.
26. Constantinescu C. Intermittent faults and effects on reliability of integrated circuits. In: Reliability and maintainability symposium, Lasvegas, NV, USA, 2008, pp.370-374.
27. Rashid L, Pattabiraman K and Gopalakrishnan S. Towards understanding the effects of intermittent hardware faults on programs. In: International conference on dependable systems and network workshops, Chicago, IL, USA, 2010, pp.101-106.
28. David T and Demosthenis T. Diagnosability of stochastic discrete-event systems. IEEE Trans Automat Contr 2005; 50(4): 476-492.
29. Zhang Q. An objective approach to MADM with interval numbers. J Commun Comput 2008; 10(5): 37-51.
30. QJ 3138-2001. Guideline of environmental stress screening for aerospace products. 2001 [in Chinese].
31. Wan SP. Fusion method for interval number multi-sensor information. J Syst Sci Inform 2009; 7(2): 119-128.
32. Deng JL. Introduction to grey system theory. J Grey Syst 1989; 1: 1-24.
33. Lv KH. Research on BIT false alarm reducing and fault prognostics technologies based on time stress analysis. PhD Thesis, National University of Defense Technology, 2008 [in Chinese].