Intermittent faults and effects on reliability of integrated circuits

Proceedings - Annual Reliability and Maintainability Symposium

Volumn , Issue , 2008, Pages

  Constantinescu, Cristian ^a  

^a ADVANCED MICRO DEVICES   (United States)

Author keywords

Intermittent faults; Oxide breakdown; Process variations; Timing violations

Indexed keywords

AGGRESSIVE SCALING; BURSTINESS; CIRCUIT COMPLEXITY; CORRECTING CODES; ERROR RATE; FAULT AVOIDANCE; FAULT TOLERANT TECHNIQUE; FAULT-TOLERANT; HIGH-ENERGY PARTICLES; INSTRUCTION RETRY; INTERMITTENT FAULT; INTERMITTENT FAULTS; OPERATING TEMPERATURE; OXIDE BREAKDOWN; PARTICLE-INDUCED SOFT ERRORS; PROCESS VARIATIONS; ROOT CAUSE; SELF CHECKING; TIMING VIOLATIONS;

ELECTRIC POTENTIAL; ERROR CORRECTION; FAILURE ANALYSIS; INTEGRATED CIRCUITS; MAINTAINABILITY; MICROPROCESSOR CHIPS; QUALITY ASSURANCE; RANDOM ACCESS STORAGE; SAFETY FACTOR; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR SWITCHES; TIME MEASUREMENT;

ELECTRIC FAULT CURRENTS;

EID: 67650305371     PISSN: 0149144X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RAMS.2008.4925824     Document Type: Conference Paper

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