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Volumn 102, Issue 21, 2013, Pages

Integration of on-chip field-effect transistor switches with dopantless Si/SiGe quantum dots for high-throughput testing

(5) Ward, D R a Savage, D E b Lagally, M G b Coppersmith, S N a Eriksson, M A a

a University of Wisconsin Madison (United States)

b UNIVERSITY OF WISCONSIN MADISON (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FIELD EFFECT TRANSISTORS; NANOCRYSTALS; POINT CONTACTS; QUANTUM CHEMISTRY; REFRIGERATORS; SEMICONDUCTOR QUANTUM DOTS; SILICON; THRESHOLD VOLTAGE;

CRYOGENIC MEASUREMENT; DILUTION REFRIGERATOR; DOUBLE QUANTUM DOTS; HIGH THROUGHPUT TESTING; PINCH OFF VOLTAGE; QUANTUM DEVICE; QUANTUM POINT CONTACT; SYSTEMATIC VARIATION;

INTEGRATION TESTING;

EID: 84879078574 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.4807768 Document Type: Article

Times cited : (47)

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