Recrystallization of Cu(In,Ga)Se2 thin films studied by X-ray diffraction

Acta Materialia

Volumn 61, Issue 12, 2013, Pages 4347-4353

  Rodriguez Alvarez, H ^a,b   Barreau, N ^c   Kaufmann, C A ^a   Weber, A ^a   Klaus, M ^a   Painchaud, T ^c   Schock, H W ^a   Mainz, R ^a  

^a HAHN MEITNER INSTITUT   (Germany)

^b INTERNATIONAL IBERIAN NANOTECHNOLOGY LABORATORY   (Portugal)

^c UNIVERSITÉ DE NANTES   (France)

Author keywords

Cu(In,Ga)Se2; Recrystallization; Stacking faults; X ray diffraction

Indexed keywords

CHALCOPYRITE STRUCTURES; CU (IN ,GA)SE; ENERGY-DISPERSIVE X-RAY DIFFRACTION; MODELING DIFFRACTION; REAL TIME; REAL-TIME STUDIES; SOLAR-CELL APPLICATIONS; TEMPERATURE RANGE;

CRYSTALLIZATION; DIFFRACTION PATTERNS; GALLIUM; INTERFEROMETRY; RECRYSTALLIZATION (METALLURGY); SEMICONDUCTING SELENIUM COMPOUNDS; STACKING FAULTS; THIN FILMS; X RAY DIFFRACTION;

COPPER;

EID: 84878617474     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2013.04.006     Document Type: Article

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