Enhanced performance of organic photovoltaics by TiO 2 -interlayer with precisely controlled thickness between ZnO electron collecting and active layers

Applied Surface Science

Volumn 279, Issue , 2013, Pages 380-383

  Kim, Kwang Dae ^a   Lim, Dong Chan ^b   Seo, Hyun Ook ^a   Lee, Joo Yul ^b   Seo, Bo Yeol ^b   Lee, Da Ji ^b   Song, Youngsup ^b   Cho, Shinuk ^c   Lim, Jae Hong ^b   Kim, Young Dok ^a  

^a Sungkyunkwan University   (South Korea)

^b Korea Institute of Material Science   (South Korea)

^c University of Ulsan   (South Korea)

Author keywords

Atomic layer deposition; Organic photovoltaic; Surface defect; ZnO

Indexed keywords

II-VI SEMICONDUCTORS; SURFACE DEFECTS; TITANIUM DIOXIDE; ZINC OXIDE;

ACTIVE LAYER; CONTROLLED THICKNESS; ORGANIC PHOTOVOLTAICS; PHOTON ABSORPTIONS; PRECISE CONTROL; RECOMBINATION CENTERS; RIPPLE STRUCTURE; THIN LAYERS;

ATOMIC LAYER DEPOSITION;

EID: 84878558078     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2013.04.119     Document Type: Article

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