Imaging Secondary Ion Mass Spectroscopy

Handbook of Nanoscopy

Volumn 2, Issue , 2012, Pages 709-744

  Moore, Katie L ^a   Schröder, Markus ^a   Grovenor, Chris R M ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Matrix effect; SIMS; Sputter yield; Sputtering; Static limit; Transient

Indexed keywords

EID: 84878461691     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1002/9783527641864.ch21     Document Type: Chapter

References (85)

1. Vickerman, J.C.E., Brown, A.E., and Reed, N.M.E. (1989) Secondary Ion Mass Spectrometry Principles and Applications, Clarendon Press.
2. Wilson, R.G., Stevie, F.A., and Magee, C.W. (1989) Secondary Ion Mass Spectrometry: A Practical Handbook for Depth Profiling and Bulk Impurity Analysis, vol. 1, John Wiley & Sons, Inc., New York, (various pagings).
3. Benninghoven, A., Reudenauer, F.G., and Werner, H.W. (1987) Secondary Ion Mass Spectrometry: Basic Concepts, Instrumental Aspects, Applications, and Trends (Chemical Analysis), John Wiley & Sons, Inc., New York.
4. Sigmund, P. (1969) Theory of sputtering. I. Sputtering yield of amorphous and polycrystalline targets. Phys. Rev., 184(2), 383.
5. CAMECA http://www.cameca.com/inst ruments-for-research/sims-static.aspx (accessed 04 October 2010).
6. Guerquin-Kern, J.L., Wu, T.D., Quintana, C., and Croisy, A. (2005) Progress in analytical imaging of the cell by dynamic secondary ion mass spectrometry (SIMS microscopy). Biochim. Biophys. Acta, 1724 (3), 228-238.
7. Benninghoven, A. (1971) Beobachtung von oberflachenreaktionen mit der statischen methode der sekundarionen-massenspektroskopie. I die methode. Surf. Sci., 28 (2), 541-562.
8. CAMECA http://www.cameca.com/instru ments-for-research/sims-dynamic.aspx (accessed 04 October 2010).
9. Whitlow, H.J., Hautala, M., and Sundqvist, B.U.R. (1987) Collision cascade parameters for slow particles impinging on biomolecule targets. Int. J. Mass Spectrom. Ion Process., 78, 329-340.
10. Benninghoven, A. (1979) in Secondary Ion Mass Spectrometry, SIMS-II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Stanford, California, USA, 1979, Springer Series in Chemical Physics, Vol. xiii, Springer-Verlag, Berlin, p. 298.
11. Benninghoven, A. (1983) Some aspects of secondary ion mass-spectrometry of organic-compounds. Int. J. Mass Spectrom. Ion Processes, 53, 85-99.
12. Yu, M.L. (1978) Work-function dependence of negative-ion production during sputtering. Phys. Rev. Lett., 40 (9), 574-577.
13. Yu, M.L. and Lang, N.D. (1983) Direct evidence of electron-tunneling in the ionization of sputtered atoms. Phys. Rev. Lett., 50 (2), 127-130.
14. Vickerman, J.C., and Briggs, D., SurfaceSpectra Limited (2001) ToF-SIMS: Surface Analysis by Mass Spectrometry, vol. 9, IM; SurfaceSpectra, Chichester, MA, 789 p.
15. Littmark, U. and Hofer, W.O. (1978) Influence of surface-structures on sputtering - angular-distribution and yield from faceted surfaces. J. Mater. Sci., 13 (12), 2577-2586.
16. Philipp, P. (2008) Applications of SIMS: Introduction - Depth Profiling I - II, NANOBEAMS PhD School Week 2.
17. Werner, H.W. and Warmoltz, N. (1976) The influence of selective sputtering on surface composition. Surf. Sci., 57 (2), 706-714.
18. Albers, T., Neumann, M., Lipinsky, D., Wiedmann, L., and Benninghoven, A. (1994) Combined depth profile analysis with SNMS, SIMS and XPS - preferential sputtering and oxygen-transport in binary metal-oxide multilayer systems. Surf. Interface Anal., 22 (1-12), 9-13.
19. Evans, C. http://www.eaglabs.com/training/tutorials/sims_theory_tutorial/index.php (accessed 04 October 2010).
20. Levi-Setti, R., Hallegot, P., Girod, C., Chabala, J.M., Li, J., Sodonis, A., and Wolbach, W. (1991) Critical issues in the application of a gallium probe to high-resolution secondary ion imaging. Surf. Sci., 246 (1-3), 94-106.
21. Downard, K., Royal Society of Chemistry (Great Britain) (2004) Mass Spectrometry: A Foundation Course, vol. 16, Royal Society of Chemistry, Cambridge, p. 210.
22. Clode, P.L., Stern, R.A., and Marshall, A.T. (2007) Subcellular imaging of isotopically labeled carbon compounds in a biological sample by ion microprobe (NanoSIMS). Microsc. Res. Tech., 70 (3), 220-229.
23. Liebl, H. (1975) Ion probe microanalysis. J. Phys. E, 8 (10), 797-808.
24. van der Heide, P.A.W., Lim, M.S., Perry, S.S., and Bennett, J. (2003) A systematic study of the surface roughening and sputter rate variations occurring during SIMS ultrashallow depth profile analysis of Si with Cs+. Nucl. Instrum. Methods. Phys. Res. B, 201 (2), 413-425.
25. Wittmaack, K. (1996) Sputtering yield changes, surface movement and apparent profile shifts in SIMS depth analyses of silicon using oxygen primary ions. Surf. Interface Anal., 24 (6), 389-398.
26. Evans, C. http://www.eaglabs.com/files/posters/PS703.pdf (accessed 04 October 2010).
27. Ramseyer, G.O. and Morrison, G.H. (1983) Relative sensitivity factors of elements in quantitative secondary ion mass-spectrometric analysis of biological reference materials. Anal. Chem., 55 (12), 1963-1970.
28. Levi-Setti, R.R. (1988) Structural and microanalytical imaging of biological materials by scanning microscopy with heavy-ion probes. Annu. Rev. Biophys. Biophys. Chem., 17, 325-347.
29. Vickerman, J.C. and Gilmore, I.S. (2009) Surface Analysis: The Principal Techniques, vol. 19, 2nd edn, John Wiley & Sons, Ltd, Chichester, 666 p.
30. Gnaser, H. (1996) Initial stages of cesium incorporation on keV-Cs+-irradiated surfaces: positive-ion emission and work-function changes. Phys. Rev. B., 54 (23), 17141-17146.
31. Burns, M.S. (1988) Biological microanalysis by secondary ion mass-spectrometry - status and prospects. Ultramicroscopy, 24 (2-3), 269-281.
32. Migeon, H.N., Schuhmacher, M., and Slodzian, G. (1990) Analysis of insulating specimens with the Cameca Ims4f. Surf. Interface Anal., 16 (1-12), 9-13.
33. Schröder, M. (2006) Flugzeit-Sekundärionenmassenspektrometrie an Thiol-self-assembly-Mmonolagen auf Gold, PhD thesis. Physikalisches Institut, Westfälische Wilhelms-Universität, Münster.
34. Krohn, V.E. and Ringo, G.R. (1975) Ion-source of high brightness using liquid-metal. Appl. Phys. Lett., 27 (9), 479-481.
35. Kollmer, F. (2004) Cluster primary ion bombardment of organic materials. Appl. Surf. Sci., 231-232, 153-158.
36. Wucher, A. (2006) Molecular secondary ion formation under cluster bombardment: a fundamental review. Appl. Surf. Sci., 252 (19), 6482-6489.
37. Brunelle, A. and Laprevote, O. (2009) Lipid imaging with cluster time-of-flight secondary ion mass spectrometry. Anal. Bioanal. Chem., 393 (1), 31-35.
38. Alikhanov, S.G. (1957) A new impulse technique for ion mass measurements. Sov. Phys. JETP-USSR, 4 (3), 452-453.
39. Slodzian, G., Daigne, B., Girard, F., Boust, F., and Hillion, F. (1992) Scanning secondary ion analytical microscopy with parallel detection. Biol. Cell, 74 (1), 43-50.
40. CAMECA http://www.cameca.fr/doc_en_pdf/ns50_instrumentation_booklet.pdf (accessed June 2007), Instrumentation booklet.
41. Stadermann, F.J. http://www.nrims.hms. harvard.edu/slides/Stadermann.pdf (accessed 04 October 2010).
42. Newbury, D.E. (1986) Advanced Scanninge electron Microscopy and X-ray Microanalysis, vol. xii, Plenum, New York, London, 454 p.
43. Evans, C. http://www.eaglabs.com/techni ques/analytical_techniques/gdms.php (accessed 04 October 2010).
44. Lombi, E., Scheckel, K.G., and Kempson, I.M. (2011) In situ analysis of metal(loid)s in plants: state of the art and artefacts. Environ. Exp. Bot., 72 (1), 3-17.
45. Lombi, E., Scheckel, K.G., Pallon, J., Carey, A.M., Zhu, Y.G., and Meharg, A.A. (2009) Speciation and distribution of arsenic and localization of nutrients in rice grains. New Phytol., 184 (1), 193-201.
46. Lozano-Perez, S., Schroder, M., Yamada, T., Terachi, T., English, C.A., and Grovenor, C.R.M. (2008) Using NanoSIMS to map trace elements in stainless steels from nuclear reactors. Appl. Surf. Sci., 255 (4), 1541-1543.
47. Jolliffe, I.T. (2002) Principal Component Analysis, vol. xxix, 2nd edn, Springer, New York, London, 487 p.
48. Larsen, R. (2002) Decomposition using maximum autocorrelation factors. J. Chemom., 16 (8-10), 427-435.
49. Tyler, B.J. (2006) Multivariate statistical image processing for molecular specific imaging in organic and bio-systems. Appl. Surf. Sci., 252 (19), 6875-6882.
50. Breitenstein, D., Rommel, C.E., Mollers, R., Wegener, J., and Hagenhoff, B. (2007) The chemical composition of animal cells and their intracellular compartments reconstructed from 3D mass spectrometry. Angew. Chem. Int. Ed., 46 (28), 5332-5335.
51. Breitenstein, D., Rommel, C.E., Stolwijk, J., Wegener, J., and Hagenhoff, B. (2008) The chemical composition of animal cells reconstructed from 2D and 3D ToF-SIMS analysis. Appl. Surf. Sci., 255 (4), 1249-1256.
52. Möller, J. (2008) Analysen kryopr äparierter nicht-dehydrierter Probensysteme mit Hilfe eines neu entwickelten ToF-SIMS-Instruments mit integrierter Hochvakuumkryoschnittapparatur, PhD thesis. Physikalisches Institut, Westfälische Wilhelms-Universität, Münster.
53. Fragu, P., Briancon, C., Fourre, C., Clerc, J., Casiraghi, O., Jeusset, J., Omri, F., and Halpern, S. (1992) Sims microscopy in the biomedical field. Biol. Cell, 74 (1), 5-18.
54. Heeren, R.M.A., McDonnell, L.A., Amstalden, E., Luxembourg, S.L., Altelaar, A.F.M., and Piersma, S.R. (2006) Why don't biologists use SIMS? A critical evaluation of imaging MS. Appl. Surf. Sci., 252 (19), 6827-6835.
55. Burns, M.S. (1982) Applications of secondary ion mass-spectrometry (SIMS) in biological-research - a review. J. Microsc. (Oxford), 127, 237-258.
56. Chandra, S., Smith, D.R., and Morrison, G.H. (2000) Subcellular imaging by dynamic SIMS ion microscopy. Anal. Chem., 72 (3), 104a-114a.
57. Galle, P. (1970) Sur une nouvelle methode d'analyse cellulaire utilisant le phenomene d'emission ioniqe secondaire. Ann. Phys., Biol. Med., 42, 83.
58. Grignon, N., Halpern, S., Gojon, A., and Fragu, P. (1992) N-14 and N-15 imaging by SIMS microscopy in soybean leaves. Biol. Cell, 74 (1), 143-146.
59. Moore, K.L., Schroder, M., Lombi, E., Zhao, F.J., McGrath, S.P., Hawkesford, M.J., Shewry, P.R., and Grovenor, C.R.M. (2010) NanoSIMS analysis of arsenic and selenium in cereal grain. New Phytol., 185 (2), 434-445.
60. Clode, P.L., Kilburn, M.R., Jones, D.L., Stockdale, E.A., Cliff, J.B., Herrmann, A.M., and Murphy, D.V. (2009) In situ mapping of nutrient uptake in the rhizosphere using nanoscale secondary ion mass spectrometry. Plant Physiol., 151 (4), 1751-1757.
61. Behrens, S., Losekann, T., Pett-Ridge, J., Weber, P.K., Ng, W.O., Stevenson, B.S., Hutcheon, I.D., Relman, D.A., and Spormann, A.M. (2008) Linking microbial phylogeny to metabolic activity at the single-cell level by using enhanced element labeling-catalyzed reporter deposition fluorescence in situ hybridization (EL-FISH) and NanoSIMS. Appl. Environ. Microbiol., 74 (10), 3143-3150.
62. Lechene, C., Hillion, F., McMahon, G., Benson, D., Kleinfeld, A., Kampf, J.P., Distel, D., Luyten, Y., Bonventre, J., Hentschel, D., Park, K., Ito, S., Schwartz, M., Benichou, G., and Slodzian, G. (2006) High-resolution quantitative imaging of mammalian and bacterial cells using stable isotope mass spectrometry. J. Biol., 5 (6), 20.
63. Cooke, R. and Kuntz, I.D. (1974) Properties of water in biological-systems. Ann. Rev. Biophys. Bioeng., 3, 95-126.
64. Mentre, P. (1992) Preservation of the diffusible cations for SIMS microscopy. I. A problem related to the state of water in the cell. Biol. Cell, 74 (1), 19-30.
65. Chandra, S. and Morrison, G.H. (1995) Imaging ion and molecular-transport at subcellular resolution by secondary-ion mass-spectrometry. Int. J. Mass Spectrom. Ion Process., 143, 161-176.
66. Hayat, M.A. (2000) Principles and Techniques of Electron Microscopy: Biological Applications, vol. xix, 4th edn, Cambridge University Press, Cambridge, 543 p.
67. Chandra, S. and Morrison, G.H. (1992) Sample preparation of animal-tissues and cell-cultures for secondary ion mass-spectrometry (SIMS) microscopy. Biol. Cell, 74 (1), 31-42.
68. Stika, K.M., Bielat, K.L., and Morrison, G.H. (1980) Diffusible ion localization by ion microscopy - a comparison of chemically prepared and fast-frozen, freeze-dried, unfixed liver sections. J. Microsc. (Oxford), 118, 409-420.
69. Lau, K.H., Christlieb, M., Schröder, M., Sheldon, H., Harris, A.L., and Grovenor, C.R.M. (2010) Development of a new bimodal imaging methodology; a combination of fluorescence microscopy and high resolution secondary ion mass spectrometry. J. Microsc., 240 (1), 21-31.
70. Dahl, R. and Staehelin, L.A. (1989) High-pressure freezing for the preservation of biological structure - theory and practice. J. Electron Microsc. Tech., 13 (3), 165-174.
71. Steinbrecht, R.A. and Zierold, K. (1987) Cryotechniques in Biological Eelectron Microscopy, vol. xvii, Springer-Verlag, Berlin, London, 297 p.
72. Studer, D., Graber, W., Al-Amoudi, A., and Eggli, P. (2001) A new approach for cryofixation by high-pressure freezing. J. Microsc. (Oxford), 203, 285-294.
73. McDonald, K.L. and Auer, M. (2006) High-pressure freezing, cellular tomography, and structural cell biology. Biotechniques, 41 (2), 137-143.
74. Hajibagheri, M.A. and Flowers, T.J. (1993) Use of freeze-substitution and molecular distillation drying in the preparation of Dunaliella-Parva for ion localization studies by X-ray-microanalysis. Microsc. Res. Tech., 24 (5), 395-399.
75. Giddings, T.H. and Staehelin, L.A. (1980) Ribosome binding-sites visualized on freeze-fractured membranes of the rough endoplasmic-reticulum. J. Cell Biol., 85 (1), 147-152.
76. Livesey, S.A. and Linner, J.G. (1987) Cryofixation taking on a new look. Nature, 327 (6119), 255-256.
77. Kellenberger, E. (1991) The potential of cryofixation and freeze substitution - observations and theoretical considerations. J. Microsc. (Oxford), 161, 183-203.
78. Huang, C.X., Canny, M.J., Oates, K., and Mccully, M.E. (1994) Planing frozen-hydrated plant specimens for SEM observation and EDX microanalysis. Microsc. Res. Tech., 28 (1), 67-74.
79. Chandra, S. (2008) Challenges of biological sample preparation for SIMS imaging of elements and molecules at subcellular resolution. Appl. Surf. Sci., 255 (4), 1273-1284.
80. Chandra, S., Bernius, M.T., and Morrison, G.H. (1986) in Proceedings of the Fifth International Conference on Secondary Ion Mass Spectrometry: SIMS V (eds A. Benninghoven, R.J. Colton, and D.Simons), Springer-Verlag, Berlin, p. 429.
81. Derue, C., Gibouin, D., Lefebvre, F., Studer, D., Thellier, M., and Ripoll, C. (2006) Relative sensitivity factors of inorganic cations in frozen-hydrated standards in secondary ion MS analysis. Anal. Chem., 78 (8), 2471-2477.
82. Metzner, R., Schneider, H.U., Breuer, U., and Schroeder, W.H. (2008) Imaging nutrient distributions in plant tissue using time-of-flight secondary ion mass spectrometry and scanning electron microscopy. Plant Physiol., 147 (4), 1774-1787.
83. Smart, K.E., Smith, J.A.C., Kilburn, M.R., Martin, B.G.H., Hawes, C., and Grovenor, C.R.M. (2010) High-resolution elemental localization in vacuolate plant cells by nanoscale secondary ion mass spectrometry. Plant J., 63 (5), 870-879.
84. Sparks, J.P., Chandra, S., Derry, L.A., Parthasarathy, M.V., Daugherty, C.S., and Griffin, R. (2011) Subcellular localization of silicon and germanium in grass root and leaf tissues by SIMS: evidence for differential and active transport. Biogeochemistry, 104, 237-249.
85. Derue, C., Gibouin, D., Demarty, M., Verdus, M.C., Lefebvre, F., Thellier, M., and Ripoll, C. (2006) Dynamic-SIMS imaging and quantification of inorganic ions in frozen-hydrated plant samples. Microsc. Res. Tech., 69 (1), 53-63.