SCOPUS 정보 검색 플랫폼

Soft Matter

Volumn 9, Issue 23, 2013, Pages 5581-5593

Optimised determination of viscoelastic properties using compliant measurement systems

(3) Andrews, James W a Bowen, James a Cheneler, David a

a UNIVERSITY OF BIRMINGHAM (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPE (AFM); EQUIVALENCE PRINCIPLES; EXPERIMENTAL PARAMETERS; ORDERS OF MAGNITUDE; VISCO-ELASTIC MATERIAL; VISCOELASTIC HALF-SPACE; VISCOELASTIC MODULI; VISCOELASTIC PROPERTIES;

ATOMIC FORCE MICROSCOPY; MEASUREMENTS; MODELS; OPTICAL TWEEZERS; OPTIMIZATION; YIELD STRESS;

VISCOELASTICITY;

EID: 84878072014 PISSN: 1744683X EISSN: 17446848 Source Type: Journal
DOI: 10.1039/c3sm50706h Document Type: Article

Times cited : (10)

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