Flat frequency response in the electronic measurement of Boltzmann's constant

IEEE Transactions on Instrumentation and Measurement

Volumn 62, Issue 6, 2013, Pages 1518-1523

  Qu, Jifeng ^a   Fu, Yunfeng ^a   Zhang, Jianqiang ^a,b   Rogalla, Horst ^c,d,e   Pollarolo, Alessio ^a   Benz, Samuel P ^a  

^a NATIONAL INSTITUTE OF METROLOGY   (China)

^b QILU UNIVERSITY OF TECHNOLOGY   (China)

^c NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^d University of Colorado at Boulder   (United States)

^e UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

Correlation; Johnson noise; Josephson voltage standard; noise measurement; temperature measurement

Indexed keywords

COMMITTEE ON DATA FOR SCIENCE AND TECHNOLOGIES; ELECTRONIC MEASUREMENTS; FLAT FREQUENCY RESPONSE; JOHNSON NOISE; JOSEPHSON VOLTAGE STANDARDS; NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY; NOISE MEASUREMENTS; RELATIVE COMBINED UNCERTAINTY;

BANDWIDTH; DATA INTEGRATION; OPTICAL CORRELATION; TEMPERATURE MEASUREMENT;

UNCERTAINTY ANALYSIS;

EID: 84877927054     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2013.2238431     Document Type: Article

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