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Volumn 46, Issue 5, 2009, Pages 512-524

Reduced non-linearities and improved temperature measurements for the NIST Johnson noise thermometer

Author keywords

[No Author keywords available]

Indexed keywords

ALIASING ERROR; COMMON-MODE REJECTION; CROSS CORRELATIONS; JOHNSON NOISE; MEASUREMENT STANDARDS; MEASUREMENT TECHNIQUES; MEASUREMENT TIME; MULTITONE; NONLINEARITIES; QUANTUM VOLTAGE NOISE; REPRODUCIBILITIES; SPECTRAL RESPONSE; VOLTAGE NOISE; WAVE FORMS;

EID: 70350671496     PISSN: 00261394     EISSN: 16817575     Source Type: Journal    
DOI: 10.1088/0026-1394/46/5/016     Document Type: Article
Times cited : (26)

References (23)
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    • Constraints on a synthetic-noise source for Johnson noise thermometry
    • White D R and Benz S P 2008 Constraints on a synthetic-noise source for Johnson noise thermometry Metrologia 45 93-101
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    • White, D.R.1    Benz, S.P.2    Labenski, J.R.3    Nam, S.W.4    Qu, J.F.5    Rogalla, H.6    Tew, W.L.7
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    • Ltspice IV is available from Linear Technologies, 1630 McCarthy Blvd, Milpitas, CA 95035-7417, USA (see http://www.linear.com/designtools/software/)
    • Ltspice IV is available from Linear Technologies, 1630 McCarthy Blvd, Milpitas, CA 95035-7417, USA (see http://www.linear.com/designtools/software/)
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    • The differential amplifiers, buffer amplifiers, and power supplies are from TSSE b.v., De Wilmskamp 2, 7552GC Hengelo, The Netherlands (see http://www.tsseshop.com)
    • The differential amplifiers, buffer amplifiers, and power supplies are from TSSE b.v., De Wilmskamp 2, 7552GC Hengelo, The Netherlands (see http://www.tsseshop.com)
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    • Datasheet AD797 (Rev. G, 09/2008) by Analog Devices: 3 Technology Way, Norwood, MA 02062, USA
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    • Datasheet AD811 (Rev. E, 07/2004) by Analog Devices: 3 Technology Way, Norwood, MA 02062, USA
    • Datasheet AD811 (Rev. E, 07/2004) by Analog Devices: 3 Technology Way, Norwood, MA 02062, USA


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.