The north American Josephson voltage Interlaboratory comparison

IEEE Transactions on Instrumentation and Measurement

Volumn 62, Issue 6, 2013, Pages 1608-1614

  Parks, Harold V ^a   Tang, Yi Hua ^b   Reese, Paul ^c,d   Gust, Jeff ^e   Novak, James J ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^c USAF   (United States)

^d MEDTRONIC INC   (United States)

^e Fluke Corporation   (United States)

Author keywords

Interlaboratory comparison (ILC); Josephson voltage standards (JVSs); measurement standards; uncertainty; voltage measurement

Indexed keywords

INTERLABORATORY COMPARISON; JOSEPHSON VOLTAGE STANDARDS; LABORATORY SYSTEM; MEASUREMENT STANDARDS; NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY; TRAVELING STANDARDS; UNCERTAINTY; ZENER VOLTAGE STANDARDS;

UNCERTAINTY ANALYSIS;

VOLTAGE MEASUREMENT;

EID: 84877923447     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2013.2238014     Document Type: Article

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