Interlaboratory comparison of Josephson voltage standards between NIST and Lockheed Martin Astronautics

IEEE Transactions on Instrumentation and Measurement

Volumn 50, Issue 2, 2001, Pages 210-213

  Tang, Yi Hua ^a   Miller, William B ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b LOCKHEED MARTIN   (United States)

Author keywords

Intercomparison; Josephson voltage standard (JVS); Measurement assurance program (MAP); Uncertainty; Zener pressure correction

Indexed keywords

BAROMETERS; CALIBRATION; CURVE FITTING; ELECTRIC POTENTIAL; STANDARDS; VOLTAGE MEASUREMENT; ZENER DIODES;

INTERCOMPARISON; JOSEPHSON VOLTAGE STANDARDS; MEASUREMENT ASSURANCE PROGRAM; ZENER PRESSURE CORRECTION;

JOSEPHSON JUNCTION DEVICES;

EID: 0035308623     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.918104     Document Type: Article

References (4)