The seventh intercomparison of Josephson voltage standards in North America

IEEE Transactions on Instrumentation and Measurement

Volumn 56, Issue 2, 2007, Pages 605-609

  Tang, Yi Hua ^a   Hamilton, Clark A ^b   Deaver, David ^c   Parks, Harold ^d   Wood, Barry M ^e  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b VMetrix   (United States)

^c Fluke Corporation   (United States)

^d SANDIA NATIONAL LABORATORIES   (United States)

^e NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

Compact Josephson voltage standard (CJVS); Interlaboratory comparison (ILC); JVS; Uncertainty; Zener standard

Indexed keywords

STANDARDIZATION; TECHNICAL PRESENTATIONS; UNCERTAINTY ANALYSIS; VOLTAGE MEASUREMENT; ZENER EFFECT;

INTERLABORATORY COMPARISON; JOSEPHSON VOLTAGE STANDARDS (JVS); ZENER STANDARD;

JOSEPHSON JUNCTION DEVICES;

EID: 34047224920     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2007.890797     Document Type: Conference Paper

References (4)

1. Y. Tang, S. Kupferman, and M. T. Salazar, "An evaluation of two methods for comparing Josephson voltage standards of two laboratories," IEEE Trans. Instrum. Meas., vol. 54, no. 1, pp. 398-403, Feb. 2005.
2. C. Hamilton, S. Kupferman, M. T. Salazar, D. Deaver, and B. Wood, "Interlaboratory comparison at 10 V dc," IEEE Trans. Instrum. Meas., vol. 54, no. 1, pp. 215-221, Feb. 2005.
3. ISO Guide to the Expression of Uncertainty in Measurement, ISO, Geneve, Switzerland, 1995, pp. 59-66. Annex G.
4. T. J. Witt and Y. Tang, "Investigations of noise in measurements of electronic voltage standards," IEEE Trans. Instrum. Meas., vol. 54, no. 2, pp. 567-570, Apr. 2005.