Femtosecond x-ray pulse length characterization at the Linac Coherent Light Source free-electron laser

New Journal of Physics

Volumn 13, Issue , 2011, Pages

  Dusterer S ^a   Radcliffe, P ^b   Bostedt, C ^c   Bozek, J ^c   Cavalieri, A L ^d   Coffee, R ^c   Costello, J T ^e   Cubaynes, D ^f   DiMauro, L F ^g   Ding, Y ^c   Doumy, G ^g,h   Gruner F ^i,k   Helml, W ^i,j   Schweinberger, W ⁱ   Kienberger, R ^i,j   Maier, A R ^i,k   Messerschmidt, M ^c   Richardson, V ^e   Roedig, C ^g   Tschentscher, T ^b   Meyer, M ^b,f   more..

^a DESY   (Germany)

^b EUROPEAN XFEL GMBH   (Germany)

^c Linac Coherent Light Source   (United States)

^d Center for Free Electron Laser Science   (Germany)

^e DUBLIN CITY UNIVERSITY   (Ireland)

^f INSTITUT DES SCIENCES MOLÉCULAIRES D ORSAY   (France)

^g OHIO STATE UNIVERSITY   (United States)

^h ARGONNE NATIONAL LABORATORY   (United States)

ⁱ MAX PLANCK INSTITUT FÜR QUANTENOPTIK   (Germany)

^j TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^k UNIVERSITY OF MUNICH   (Germany)

more..

Author keywords

[No Author keywords available]

Indexed keywords

AUGER DECAYS; CROSS CORRELATION TECHNIQUES; ELECTRON BUNCH; ELECTRON PULSE; FEMTOSECOND X-RAY PULSE; FEMTOSECONDS; LASER-ASSISTED; LINAC COHERENT LIGHT SOURCE; MEAN VALUES; NON-INVASIVE; PULSE DURATIONS; SINGLE-SHOT; TEMPORAL JITTER; THEORETICAL MODELS; TI-SAPPHIRE; TIME OF FLIGHT; TWO-COLOR; UPPER LIMITS; X RAY PULSE;

ATOMIC SPECTROSCOPY; COHERENT LIGHT; ELECTRON SPECTROSCOPY; FLIGHT CONTROL SYSTEMS; FREE ELECTRON LASERS; FREE FLIGHT; JITTER; LIGHT SOURCES; LINEAR ACCELERATORS; NEON; OPTICAL CORRELATION; SAPPHIRE; X RAYS;

ELECTRONS;

EID: 80053416322     PISSN: 13672630     EISSN: None     Source Type: Journal    
DOI: 10.1088/1367-2630/13/9/093024     Document Type: Article

References (19)

1. Emma P et al 2010 Nat. Photonics 4 641
2. Hoener M et al 2010 Phys. Rev. Lett. 104 253002
3. Berrah N et al 2010 J. Mod. Opt. 57 1015
4. Young L et al 2010 Nature 466 56
5. Doumy G et al 2011 Phys. Rev. Lett. 106 083002
6. Glownia J et al 2010 Opt. Express 18 17620
7. Cryan J P et al 2010 Phys. Rev. Lett. 105 083004
8. Helml W et al submitted
9. Glover T E, Schoenlein R W, Chin A H and Shank C V 1996 Phys. Rev. Lett. 76 2468
10. Meyer M et al 2006 Phys. Rev. A 74 011401
11. Schins J M, Breger P, Agostini P, Constantinescu R C, Muller H G, Grillon G, Antonetti A and Mysyrowics A 1994 Phys. Rev. Lett. 73 2180
12. Southworth S H, Kanter E P, Krässig B, Young L, Armen G B, Levin J C, Ederer D L and Chen M H 2003 Phys. Rev. A 67 062712
13. Bozek J 2009 Eur. Phys. J. 169 129
14. Roedig C et al submitted
15. Hau-Riege S P, Bionta R M, Ryutov D D and Krzywinski J 2008 J. Appl. Phys. 103 053306
16. Meyer M, Costello J T, Düsterer S, Li W B and Radcliffe P 2010 J. Phys. B: At. Mol. Opt. Phys. 43 194006
17. Maquet A and Taïeb R 2007 J. Mod. Opt. 54 1847
18. Meyer M et al 2008 Phys. Rev. Lett. 101 193002
19. Reiche S et al 1999 Nucl. Instrum. Methods A 429 243