Dynamic behavior models of analog to digital converters aimed for post-correction in wideband applications

18th IMEKO World Congress 2006: Metrology for a Sustainable Development

Volumn 2, Issue , 2006, Pages 1344-1348

  Björsell, Niclas ^a   Händel, Peter ^b  

^a UNIVERSITY OF GÄVLE   (Sweden)

^b ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

Author keywords

Analog to digital converters; Modeling; Wideband applications

Indexed keywords

ANALOG TO DIGITAL CONVERTERS; CORRECTION METHOD; HAMMERSTEIN MODEL; INTEGRAL NONLINEARITY; MODEL-BASED CORRECTIONS; NON-PARAMETRIC MODEL; STATIC NON-LINEARITY; WIDEBAND APPLICATIONS;

MODELS; PLANNING; TABLE LOOKUP; UNITS OF MEASUREMENT;

SUSTAINABLE DEVELOPMENT;

EID: 84877775320     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

1. P. Arpaia, P. Daponte, and S. Rapuano, "A state of the art on ADC modelling, " Elsevier Computer Standards & Interfaces, vol. 26, pp. 31-42, 2003.
2. P. Händel, M. Skoglund, and M. Pettersson, "A calibration scheme for imperfect quantizers, " IEEE Transactions on Instrumentation and Measurement, vol. 49, pp. 1063-8, 2000.
3. N. Björsell and P. Händel, "On Gaussian and Sine wave Histogram Tests for Wideband Applications, " IMTC, Ottawa, 2005.
4. H. Lundin, M. Skoglund, and P. Händel, "A Criterion for Optimizing Bit-Reduced Post-Correction of AD Converters, " IEEE Transactions on Instrumentation and Measurements, vol. 53, pp. 1159-1166, 2004.
5. J. Tsimbinos, "Identification and compensation of nonlinear distortion, " in Institute of Telecommunications Research: University of South Australia, 1995.
6. D. Mirri, G. Iuculano, F. Filicori, G. Pasini, and G. Vannini, "Modeling of non ideal dynamic characteristics in S/H-ADC devices, " Proceedings of 1995 IEEE Instrumentation and Measurement Technology Conference-IMTC '95, 24-26 April 1995, Waltham, MA, USA, pp. 27-32, 1995.
7. L. Michaeli, P. Michalko, and J. Saliga, "Identification of unified ADC error model by triangular testing signal, " 10th Workshop on ADC modelling and testing, Gdynia/Jurata, Poland, pp. 605-610, 2005.
8. IEEE, "Std 1241-2000 IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters", IEEE, 2000.