Plasmonic Control of Near-Interface Exciton Dynamics in Defect-Rich ZnO Thin Films

Plasmonics

Volumn 8, Issue 2, 2013, Pages 693-697

  Lawrie, B J ^a,d   Mu, R ^b   Haglund, R F ^c  

^a VANDERBILT UNIVERSITY   (United States)

^b FISK UNIVERSITY   (United States)

^c VANDERBILT UNIVERSITY   (United States)

^d OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

Interface defects; Purcell effect; Ultrafast spectroscopy

Indexed keywords

EID: 84877604435     PISSN: 15571955     EISSN: 15571963     Source Type: Journal    
DOI: 10.1007/s11468-012-9459-9     Document Type: Article

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