-
1
-
-
84877250148
-
-
MIL-STD 883E Test Method 1014
-
MIL-STD 883E, Test Method 1014.
-
-
-
-
2
-
-
84877250980
-
Cumulative Helium Leak Detection (CHLD)
-
May 7-10 2007, Baltimore MD
-
J. Pernicka, "Cumulative Helium Leak Detection (CHLD)", Military, Aerospace, Space, and Homeland Security 2007, May 7-10, 2007, Baltimore, MD
-
(2007)
Military, Aerospace, Space, and Homeland Security
-
-
Pernicka, J.1
-
3
-
-
0016557318
-
Calculations for leak rates of hermetic packages
-
Sept. PHP-11
-
Radifo document iv J. G. Davy, "Calculations for leak rates of hermetic packages", IEEE Transactions on Party, Hybrids, and Packaging, vol. PHP-11, No. 3, Sept., 1975, pp. 177-189.
-
(1975)
IEEE Transactions on Party, Hybrids, and Packaging
, Issue.3
, pp. 177-189
-
-
Davy, J.G.1
-
4
-
-
84877273609
-
How to raise the permissible leak rate by four orders of magnitude
-
May
-
J. G. Davy, "How to raise the permissible leak rate by four orders of magnitude", NBSIR 84-2852, RADC/NBS Workshop, Moisture Measurement and Control for Semiconductor Devices, III, May, 1984, pp. 180-195.
-
(1984)
NBSIR 84-2852, RADC/NBS Workshop, Moisture Measurement and Control for Semiconductor Devices
, vol.3
, pp. 180-195
-
-
Davy, J.G.1
-
5
-
-
84877258794
-
Hermeticity and moisture ingress
-
May
-
A. DerMarderosian, "Hermeticity and moisture ingress", NBSIR 84-2852, RADC/NBS Workshop, Moisture Measurement and Control for Semiconductor Devices, III, May, 1984, pp. 196-216.
-
(1984)
NBSIR 84-2852, RADC/NBS Workshop, Moisture Measurement and Control for Semiconductor Devices
, vol.3
, pp. 196-216
-
-
Dermarderosian, A.1
-
6
-
-
84877270304
-
Hermeticity-A tutorial
-
A. DerMarderosian, "Hermeticity-A Tutorial", Proceedings IRPS, 1984, pp. 1. 3-18 to 1. 3-33.
-
(1984)
Proceedings IRPS
, Issue.3-33
, pp. 13-181
-
-
Dermarderosian, A.1
-
7
-
-
0017417365
-
On the penetration of gases and water vapour into packages with cavities and on maximum allowable leak rates
-
D. Stroehle, "On the penetration of gases and water vapour into packages with cavities and on maximum allowable leak rates", Proceedings IRPS, 1980, pp. 101-106.
-
(1980)
Proceedings IRPS
, pp. 101-106
-
-
Stroehle, D.1
-
8
-
-
0032319171
-
Variable leak rate phenomena in glass-to-metal seals
-
K. Winkelmann, private communication viii R. A. Clarke, A. DerMarderosian, "Variable leak rate phenomena in glass-to-metal seals", Intl. Symposium on Microelectronics, 1998, pp. 828-832
-
(1998)
Intl. Symposium on Microelectronics
, pp. 828-832
-
-
Winkelmann Private Communication Viii, K.1
Clarke, A.R.2
Dermarderosian, A.3
-
9
-
-
41149116566
-
Measuring Mass Flows in Hermetically Sealed MEMs & MOEMs to Ensure Device Reliability
-
January in process, #6884-19
-
R. C. Kullberg, D. J. Rossiter, ""Measuring Mass Flows in Hermetically Sealed MEMs & MOEMs to Ensure Device Reliability. " SPIE, January 2008, in process, #6884-19
-
(2008)
SPIE
-
-
Kullberg, R.C.1
Rossiter, D.J.2
-
11
-
-
0024096667
-
Outgassing characteristics of some thermal insulating and constructional materials used in vacuum applications
-
Ottobre-Dicembre
-
F. Sciuccati, G. Gasparini, B. Ferrario, "Outgassing characteristics of some thermal insulating and constructional materials used in vacuum applications. " Vuoto, Vol. XVIII, N. 4, Ottobre-Dicembre 1998
-
(1998)
Vuoto
, vol.18
, Issue.4
-
-
Sciuccati, F.1
Gasparini, G.2
Ferrario, B.3
-
12
-
-
0032304947
-
Vacuum maintenance in hermetically sealed mems packages
-
A. Corazza, R. C. Kullberg, "Vacuum Maintenance In Hermetically Sealed MEMs Packages," Proceedings of the SPIE, Vol. 3514 p. 82-89 (1998)
-
(1998)
Proceedings of the SPIE
, vol.3514
, pp. 82-89
-
-
Corazza, A.1
Kullberg, R.C.2
|