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Volumn , Issue , 2008, Pages
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Pull-out testing for individual MWCNT and functionalized MWCNT
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Author keywords
Carbon nanotubes; In situ SEM and TEM; Interfacial strength
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Indexed keywords
D. TRANSMISSION ELECTRON MICROSCOPES (TEM);
FUNCTIONALIZED-MWCNT;
IN-SITU SEM;
INTERFACIAL ADHESIONS;
INTERFACIAL INTERACTION;
INTERFACIAL STRENGTH;
MULTIWALL NANOTUBES;
THERMOPLASTIC POLYMER MATRICES;
ATOMIC FORCE MICROSCOPY;
CARBON NANOTUBES;
SCANNING ELECTRON MICROSCOPY;
TENSILE TESTING;
TRANSMISSION ELECTRON MICROSCOPY;
VAN DER WAALS FORCES;
COMPOSITE MATERIALS;
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EID: 84876762916
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (4)
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References (12)
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