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Volumn , Issue , 2012, Pages 233-244

SOI-based integrated gate driver circuit for high-temperature applications

Author keywords

Gate driver; High temperature; Silicon on insulator

Indexed keywords

GATE DRIVERS; HIGH TEMPERATURE; HIGH-TEMPERATURE ELECTRONICS; ON-CHIP VOLTAGE REGULATOR; POWER FIELD-EFFECT TRANSISTORS; SILICON ON INSULATOR; SILICON-ON-INSULATOR PROCESS; THERMAL MANAGEMENT SYSTEMS;

EID: 84876741954     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (2)

References (24)
  • 9
    • 0036072592 scopus 로고    scopus 로고
    • A low- loss high-frequency half-bridge driver with integrated power devices using EZ-HV SOI technology
    • 10-14 March
    • F. Li, D. Giannopoulos, and I. Wacyk, "A low- loss high-frequency half-bridge driver with integrated power devices using EZ-HV SOI technology, " IEEE Applied Power Electronics Conference and Exposition, 10-14 March 2002, pp. 1127 - 1132.
    • (2002) IEEE Applied Power Electronics Conference and Exposition , pp. 1127-1132
    • Li, F.1    Giannopoulos, D.2    Wacyk, I.3
  • 11
    • 17444432891 scopus 로고    scopus 로고
    • A self-boost charge pump topology for a gate drive high-side power supply
    • March
    • S. Park and T. M. Jahns, A self-boost charge pump topology for a gate drive high-side power supply, " IEEE Transactions on Power Electronics, vol. 20, no. 2, March 2005, pp. 300- 307.
    • (2005) IEEE Transactions on Power Electronics , vol.20 , Issue.2 , pp. 300-307
    • Park, S.1    Jahns, T.M.2
  • 20
    • 79955768574 scopus 로고    scopus 로고
    • An under-voltage lockout of hysteretic threshold of zero temperature coefficients
    • Dec
    • Z. Fanglan, F. Quanyuan, and G. Kunlin, "An under-voltage lockout of hysteretic threshold of zero temperature coefficients, " Microwave Conference Proceedings, vol. 2, no. 3, pp. 4- 7, Dec 2005.
    • (2005) Microwave Conference Proceedings , vol.2 , Issue.3 , pp. 4-7
    • Fanglan, Z.1    Quanyuan, F.2    Kunlin, G.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.