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0036421990
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High-Temperature automotive electronics
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Reno, NV, 10-13 March
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An SOI-Based high-voltage, high-temperature gate-driver for SiC FET
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Orlando, Florida, USA, 17-21 June
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M. Huque, R. Vijayaraghavan, M. Zhang, B. Blalock, L. Tolbert and S. Islam. "An SOI-based high-voltage, high-temperature gate-driver for SiC FET, " Proceedings of the 38th IEEE Power Electronics Specialist Conference (PESC 07), Orlando, Florida, USA, 17-21 June 2007. pp. 1491-1495.
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3
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84876890472
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SOI based integrated circuits for high- Temperature applications
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Albuquerque, New- Mexico, USA, May 13-15
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M. A Huque, B. J. Blalock, C Su, R. Vijayaraghavan, S. K. Islam, and L M. Tolbert, "SOI based integrated circuits for high- temperature applications, " in Proc. of International Conference on High Temp. Electronics (HiTEC 2008), Albuquerque, New- Mexico, USA, May 13-15, 2008.
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Proc. of International Conference on High Temp. Electronics (HiTEC 2008)
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4
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84876890619
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A high-temperature, high-voltage SOI gate driver IC with high output current and on- chip low-power temperature sensor
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San Jose, CA, Nov
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M. A. Huque, L. M. Tolbert. B. J. Blalock, and S. K. Islam. "A high-temperature, high-voltage SOI gate driver IC with high output current and on- chip low-power temperature sensor, " 42nJ International Symposium on Microelectronics (IMAPS 2009), San Jose, CA, Nov. 1-5.
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42nJ International Symposium on Microelectronics (IMAPS 2009)
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Huque, M.A.1
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Islam, S.K.4
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1442329113
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A gate drive circuit for silicon carbide JFET
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Roanoke (VA), USA, 2-6 November
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K. Mino, S. Herold and J. W. Kolar, "A gate drive circuit for Silicon Carbide JFET, " Proceedings of the 29th Annual Conference of the IEEE Industrial Electronics Society, Roanoke (VA), USA, 2-6 November 2003, pp. 1162-1166.
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Mino, K.1
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33947630139
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A simple, low cost gate drive method for practical use of SiC JFETs in SMPS
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Germany, 12-14 September
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Proceedings of the II,h European Conference on Power Electronics and Applications, Dresden
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33745891203
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A SiC JFET driver for a 5 kVV, 150 kHz three- phase PWM converter
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2-6 October
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S. Round, J. Kolar, I. Hofsajer, and P. Friedrichs, "A SiC JFET driver for a 5 kVV, 150 kHz three- phase PWM converter, " IEEE Industry Applications Conference, 2-6 October 2005, pp. 410-416.
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IEEE Industry Applications Conference
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10-14 March
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F. Li, D. Giannopoulos, and I. Wacyk, "A low- loss high-frequency half-bridge driver with integrated power devices using EZ-HV SOI technology, " IEEE Applied Power Electronics Conference and Exposition, 10-14 March 2002, pp. 1127 - 1132.
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IEEE Applied Power Electronics Conference and Exposition
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84862977057
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High temperature silicon-on-insulator gate driver for SiC-FET power modules
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J. valle-Mayorga, C. Gutshall, K. Phan, I. Escorcia-Carranza, A. Mantooth, B. Reese, M. Schupbach. A. Lostetter, "High Temperature Silicon-on-Insulator Gate Driver for SiC-FET Power Modules, " Power Electronics, IEEE Transactions on, 2012, vol.27, no.99.
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S. Park and T. M. Jahns, A self-boost charge pump topology for a gate drive high-side power supply, " IEEE Transactions on Power Electronics, vol. 20, no. 2, March 2005, pp. 300- 307.
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Park, S.1
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84876717616
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SOI based voltage regulator for high- temperature applications
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New- Mexico, USA, May 8-10
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B. M. McCue, R. L. Greenwell, M. I. Laurence, B. J. Blalock, S. K. Islam, and L. M. Tolbert, "SOI Based Voltage Regulator for High- Temperature Applications, " accepted to Proc. of International Conference on High Temp. Electronics (HiTEC 2012) Albuquerque, New- Mexico, USA, May 8-10, 2012.
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Accepted to Proc. of International Conference on High Temp. Electronics (HiTEC 2012) Albuquerque
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Wiley-IEEE
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Study on temperature effect on p-n and zener junction for PTAT temperature sensor
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An improved fast transient response low drop-out voltage regulator
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84876698389
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Diode leakage current based low- power, on-chip high temperature sensor circuit
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Yale University, New Haven, Connecticut, March 11
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M. A. Huque, S. K. Islam. B. J. Blalock, and L. M. Tolbert. "Diode leakage current based low- power, on-chip high temperature sensor circuit, " Proc. of 18th Annual Symposium on Micro- and Nano-technologies for Electronics, Photonics, Biosensors, and Alternate Energy Sources (CMOC 2009), Yale University, New Haven, Connecticut, March 11, 2009. pp. 57-58.
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An under-voltage lockout of hysteretic threshold of zero temperature coefficients
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A universal BCD- on-SOI based high temperature short circuit protection for SiC power switches
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New Mexico, USA, May 13 - 15
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L. Zuo, S. K. Islam. M. A. Huque, C. Su, B. J. Blalock, and L. M. Tolbert, "A universal BCD- on-SOI based high temperature short circuit protection for SiC power switches, " Proc. of International Conference on High Temp. Electronics (HiTEC 2010) Albuquerque, New Mexico, USA, May 13 - 15, 2010.
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Proc. of International Conference on High Temp. Electronics (HiTEC 2010) Albuquerque
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Zuo, L.1
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49249086893
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A smart gate drive with self- diagnosis for power MOSFETs and IGBTs
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IEEE Applied Power Electronics Conference and Exposition
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