SCOPUS 정보 검색 플랫폼

Thin Solid Films

Volumn 534, Issue , 2013, Pages 348-355

Detailed analysis of defect reduction in electrowetting dielectrics through a two-layer 'barrier' approach

(4) Schultz, A a Chevalliot, S a,b Kuiper, S c Heikenfeld, J a

a 705 Engineering Research Center (United States)

b Varioptic (France)

c Optilux Inc (United States)

Author keywords

Dielectric; Electrowetting; Interfacial tension; Parylene

Indexed keywords

CATASTROPHIC FAILURES; DIELECTRIC CAPACITORS; DIELECTRIC DEFECTS; DIELECTRIC SYSTEMS; ELECTRO WETTING; ELECTRODE MATERIAL; PARYLENES; POLYMER DIELECTRICS;

CAPACITORS; CONTACT ANGLE; LIQUIDS; SURFACE TENSION; WETTING;

DIELECTRIC MATERIALS;

EID: 84876682214 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2013.03.008 Document Type: Article

Times cited : (44)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.