Valence band offset at the CdS/Cu2ZnSnS4 interface probed by x-ray photoelectron spectroscopy

Journal of Physics D: Applied Physics

Volumn 46, Issue 17, 2013, Pages

  Santoni, A ^a   Biccari, F ^b   Malerba, C ^b,c   Valentini, M ^b,d   Chierchia, R ^b   Mittiga, A ^b  

^a ENEA   (Italy)

^b ENEA C R CASACCIA   (Italy)

^c UNIVERSITY OF TRENTO   (Italy)

^d SAPIENZA UNIVERSITY OF ROME   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CDS; CONDUCTION BAND OFFSET; DIRECT METHOD; INDIRECT METHODS; MEASURED VALUES; MEASUREMENTS OF; VALENCE BAND OFFSETS; VALENCE BAND SPECTRA;

HETEROJUNCTIONS; PHOTOELECTRONS;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84876502242     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/46/17/175101     Document Type: Article

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