SCOPUS 정보 검색 플랫폼

Volumn 24, Issue 7, 2009, Pages

The revolution in energy dispersive x-ray spectrometry: Spectrum imaging at output count rates above 1 mhz with the silicon drift detector on a scanning electron microscope

(1) Newbury, Dale E a

a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BEAM CURRENTS; BEAM POSITIONS; ELEMENTAL MAPPING; ENERGY DISPERSIVE X-RAY SPECTROMETRY; FIELD EMISSION GUNS; HIGH BRIGHTNESS; HIGH INTENSITY; HIGH SPATIAL RESOLUTION; HIGH THROUGHPUT; MAPPING STRATEGY; MINOR CONSTITUENTS; OUTPUT COUNT RATES; RECORD INFORMATION; SCANNING ELECTRON MICROSCOPE; SEM; SILICON DRIFT DETECTOR; SPECTRUM IMAGING; TRACE CONSTITUENTS; X RAY SPECTRUM; X-RAY MAPS;

DETECTORS; FIELD EMISSION; MAPPING; MEASUREMENT THEORY; MICROCRYSTALLINE SILICON; PIXELS; SCANNING; SCANNING ELECTRON MICROSCOPY; SPECTROMETRY; X RAY SPECTROSCOPY;

X RAYS;

EID: 84876482312 PISSN: 08876703 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (11)

References (10)

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7
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8
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- A software engine for image processing
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.