Compositional mapping by X-ray spectrum imaging at 1 MHz output count rate with the silicon drift detector

Microscopy and Microanalysis

Volumn 14, Issue SUPPL. 2, 2008, Pages 1164-1165

  Newbury, D ^a   Davis, J ^a   Bright, D ^a   Ritchie, N ^a   Michael, J ^b   Kotula, P ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 49549097144     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927608081816     Document Type: Conference Paper

References (7)

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4. Gorlen, K.E., et al., Rev. Sci. Instrum. 55 (1984) 912.
5. Newbury, D., SCANNING, 27 (2005) 227.
6. Newbury, D., et al., Microsc Microanal 13, Suppl 2 (2007) 1340CD.
7. Bright, D., Lispix, a software platform for comprehensive image processing; available free from NIST at http://www.nist.gov/lispix/doc/contents. htm.