TlBr capacitive frisch grid detectors

IEEE Transactions on Nuclear Science

Volumn 60, Issue 2, 2013, Pages 1156-1161

  Hitomi, Keitaro ^a   Tada, Tsutomu ^a   Onodera, Toshiyuki ^a   Kim, Seong Yun ^a   Xu, Yuanlai ^a   Shoji, Tadayoshi ^a   Ishii, Keizo ^b  

^a TOHOKU UNIVERSITY   (Japan)

^b TOHOKU INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Gamma ray detectors; semiconductor radiation detectors; thallium bromide; wide band gap semiconductors

Indexed keywords

CAPACITIVE FRISCH; DEPTH CORRECTIONS; DETECTOR PERFORMANCE; ENERGY RESOLUTIONS; GAMMA RAY DETECTOR; SEMICONDUCTOR RADIATION DETECTORS; THALLIUM BROMIDE; WIDE-BAND-GAP SEMICONDUCTOR;

GAMMA RAYS;

RADIATION DETECTORS;

EID: 84876295738     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2012.2217155     Document Type: Article

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