Fabrication and spectroscopy results of mercuric iodide Frisch collar detectors

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 624, Issue 3, 2010, Pages 656-661

  Ariesanti, E ^a   Kargar, A ^b   McGregor, D S ^a  

^a Kansas State University   (United States)

^b RADIATION MONITORING DEVICES INC   (United States)

Author keywords

Frisch collar spectrometer; Horizontal furnace; Mercuric iodide; Polyethylene; Vapor growth

Indexed keywords

ENERGY RESOLUTIONS; FRISCH COLLAR SPECTROMETER; HORIZONTAL FURNACE; LOW MOLECULAR WEIGHT; MERCURIC IODIDE; VAPOR GROWTH;

BARIUM; CESIUM; FURNACES; MERCURY COMPOUNDS; POLYETHYLENES; SPECTROMETRY; THERMOPLASTICS; VAPORS;

SPECTROMETERS;

EID: 78649324980     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2010.09.075     Document Type: Article

References (35)

1. G. Ottaviani, C. Canali, and A.A. Quaranta IEEE Trans. Nucl. Sci. NS-22 1975 192
2. G. Georgeson, and F. Milstein Nucl. Instr. and Meth. A 285 1989 488
3. V. Gerrish Nucl. Instr. and Meth. A 322 1992 402
4. D. McGregor, R. Rojeski, High-resolution ionization detector and array of such detectors, US Patent No. 6,175,120, January 2001.
5. W.J. McNeil, D.S. McGregor, A.E. Bolotnikov, G.W. Wright, and R.B. James Appl. Phys. Lett. 84 2004 1988
6. D.S. McGregor, A. Kargar, A.M. Jones, W.J. McNeil, and M.J. Harrison Nucl. Instr. and Meth. A 558 2006 497
7. A. Kargar, A.M. Jones, W.J. McNeil, M.J. Harrison, and D.S. McGregor Nucl. Instr. and Meth. A 558 2 2006 497
8. A. Kargar, R.B. Lowell, M.J. Harrison, D.S. McGregor, The crystal geometry and the aspect ratio effects on spectral performance of CdZnTe Frisch collar device, in: Proceedings of the Society of Photo-Optical Instrumentation, vol. 6706, 2007, p. 67061J.
9. I.F. Nicolau J. Cryst. Growth 48 1980 51
10. I. Nicolau, and J.P. Joly J. Cryst. Growth 48 1980 61
11. M. Schieber, R. Carlston, H. Lamonds, P. Randtke, F. Schnepple, and J. Llacer Nucl. Instr. and Meth. 2425 1974 205
12. M. Schieber, W. Schnepple, and L. Van Den Berg J. Cryst. Growth 33 1976 125
13. H. Lamonds Nucl. Instr. and Meth. 213 1983 5
14. H. Scholz Acta Electron. 17 1974 69
15. A.E. Bolotnikov, J. Baker, R. DeVito, J. Sandoval, and L. Szurbart IEEE Trans. Nucl. Sci. NS-52 2005 468
16. S. Faile, A. Dabrowski, G. Huth, and J. Iwanczyk J. Cryst. Growth 50 3 1980 752
17. A. Burger, M. Roth, and M. Schieber J. Cryst. Growth 56 1982 526
18. A. Burger, A. Levi, J. Nissenbaum, M. Roth, and M. Schieber J. Cryst. Growth 72 1985 643
19. J. Laskowski, H. Kuc, K. Conder, and J. Przyuski Mater. Res. Bull. 22 6 1987 715
20. J. Przyuski, and J. Laskowski Nucl. Instr. and Meth. A A283 1989 144
21. G.A. Jeffrey, and M. Vlasse Inorg. Chem. 6 2 1967 396
22. M. Hostettler, H. Birkedal, and D. Schwarzenbach Chimia 55 6 2001 541
23. T. Hahn, U. Shmueli, and A.J.C. Wilson I. U. of Crystallography, International Tables for Crystallography 1984 D. Reidel Pub. Co. Dordrecht, Holland
24. J.D. Jackson Classical Electrodynamics 1999 John Wiley & Sons, Inc.
25. W. Shockley J. Appl. Phys. 9 1938 635
26. S. Ramo IRE Proc. 27 1939 584
27. G. Cavalleri, G. Fabri, E. Gatti, and V. Svelto Nucl. Instr. and Meth. 21 1963 177
28. G. Cavalleri, G. Fabri, E. Gatti, and V. Svelto Nucl. Instr. and Meth. 92 1971 137
29. G.F. Knoll, D.S. McGregor, Fundamentals of semiconductor detectors for ionizing radiation, in: Materials Research Society Symposium Proceedings, vol. 302, 1993, pp. 317.
30. V. Radeka Ann. Rev. Nucl. Part. Sci. 38 1988 217
31. 137Cs source, Nucl. Instr. Meth. A (2010), doi:10.1016/j.nima.2010. 08.057.
32. D. McGregor, and R. Rojeski IEEE Trans. Nucl. Sci. NS-46 3 I 1999 250
33. Specialty coating systems, Model PDS 2010 LABCOTER 2 Operator's Manual, 2006.
34. P.S. Ho, J. Leu, and W.W. Lee Low Dielectric Constant Materials for IC Applications first ed. 2003 Springer New York
35. A. Kargar, A.C. Brooks, M.J. Harrison, K.T. Kohman, R.B. Lowell, R.C. Keyes, H. Chen, G. Bindley, and D.S. McGregor IEEE Trans. Nucl. Sci. NS-56 2009 824