The stability of TlBr detectors at low temperature

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 623, Issue 3, 2010, Pages 1024-1029

  Dnmez, Burin ^a   He, Zhong ^a   Kim, Hadong ^b   Cirignano, Leonard J ^b   Shah, Kanai S ^b  

^a UNIVERSITY OF MICHIGAN   (United States)

^b RADIATION MONITORING DEVICES INC   (United States)

Author keywords

Semiconductor detector; Thallium bromide; TlBr

Indexed keywords

ANODE PIXELS; ATOMIC NUMBERS; DIGITAL PULSE; DIGITIZERS; ENERGY RESOLUTIONS; GUARD-RINGS; HIGH DENSITY; HIGH VOLTAGE; LOW TEMPERATURES; MULTI-CHANNEL; PERFORMANCE DEGRADATION; PIXEL PITCH; PLANAR CATHODES; POLARIZATION EFFECT; PULSE-SHAPING; RADIATION MONITORING DEVICES INC.; THALLIUM BROMIDE; TLBR; WIDE BAND GAP;

ATOMS; BROMINE COMPOUNDS; ELECTRON MOBILITY; NUCLEAR REACTORS; POLARIZATION; SEMICONDUCTOR DETECTORS; THALLIUM;

PIXELS;

EID: 77958482137     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2010.08.024     Document Type: Article

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