Optical properties of self-assembled TiO2-SiO2 double-layered photonic crystals

Journal of Nanoscience and Nanotechnology

Volumn 13, Issue 1, 2013, Pages 686-689

  Oh, Yong Taeg ^a   Koo, Bo Ra ^a   Shin, Dong Chan ^a  

^a Chosun University   (South Korea)

Author keywords

Double layer; Optical properties; Photonic crystals; Self assemble; TiO2 SiO2

Indexed keywords

DOUBLE LAYERS; DOUBLE-LAYERED STRUCTURE; EVAPORATION METHOD; EVAPORATION PROCESS; REFLECTANCE PEAKS; SELF-ASSEMBLE; SELF-ASSEMBLED; TIO;

EVAPORATION; FILM THICKNESS; NANOSTRUCTURED MATERIALS; OPTICAL PROPERTIES; PHASE TRANSITIONS; THIN FILMS; TITANIUM DIOXIDE;

PHOTONIC CRYSTALS;

NANOMATERIAL; SILICON DIOXIDE; TITANIUM; TITANIUM DIOXIDE;

ARTICLE; CHEMISTRY; CONFORMATION; CRYSTALLIZATION; LIGHT; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; PARTICLE SIZE; PHOTON; RADIATION SCATTERING; SURFACE PLASMON RESONANCE; SURFACE PROPERTY; ULTRASTRUCTURE;

CRYSTALLIZATION; LIGHT; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MOLECULAR CONFORMATION; NANOSTRUCTURES; PARTICLE SIZE; PHOTONS; SCATTERING, RADIATION; SILICON DIOXIDE; SURFACE PLASMON RESONANCE; SURFACE PROPERTIES; TITANIUM;

MLCS; MLOWN;

EID: 84876232525     PISSN: 15334880     EISSN: 15334899     Source Type: Journal    
DOI: 10.1166/jnn.2013.6928     Document Type: Article

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