Semisupervised distance-preserving self-organizing map for machine-defect detection and classification

IEEE Transactions on Instrumentation and Measurement

Volumn 62, Issue 5, 2013, Pages 869-879

  Li, Weihua ^a   Zhang, Shaohui ^a   He, Guolin ^a  

^a SOUTH CHINA UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

Defect classification; failure detection; self organizing map (SOM); semisupervised learning

Indexed keywords

DEFECT CLASSIFICATION; DIAGNOSIS METHODS; EXPERIMENTAL STUDIES; FAILURE DETECTION; INTELLIGENT LEARNING; SELF-ORGANIZING MAP (SOM); SEMI- SUPERVISED LEARNING; TOPOLOGICAL RELATIONSHIPS;

DEFECTS; FAULT DETECTION;

CONFORMAL MAPPING;

EID: 84876054877     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2013.2245180     Document Type: Article

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