Optical lock-in particle tracking in optical tweezers

Optics Express

Volumn 21, Issue 7, 2013, Pages 8018-8024

  Taylor, Michael A ^a   Knittel, Joachim ^a   Bowen, Warwick P ^a  

^a UNIVERSITY OF QUEENSLAND   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

SPURIOUS SIGNAL NOISE;

CONTINUOUS MEASUREMENTS; ELECTRONIC NOISE; LASER NOISE; LASER RELAXATION OSCILLATIONS; LOW-FREQUENCY NOISE SOURCES; NOISE SUPPRESSION; OPTICAL FIELD; PARTICLE TRACKING;

OPTICAL TWEEZERS;

ARTICLE; EQUIPMENT; EQUIPMENT DESIGN; EQUIPMENT FAILURE; ILLUMINATION; MOLECULAR IMAGING; OPTICAL TWEEZERS; STROBOSCOPY;

EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; LIGHTING; MOLECULAR IMAGING; OPTICAL TWEEZERS; STROBOSCOPY;

EID: 84876009641     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.21.008018     Document Type: Article

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