A novel electrical resistance tomography system based on C4D technique

IEEE Transactions on Instrumentation and Measurement

Volumn 62, Issue 5, 2013, Pages 1017-1024

  Wang, Baoliang ^a   Hu, Yuanyuan ^a   Ji, Haifeng ^a   Huang, Zhiyao ^a   Li, Haiqing ^a  

^a STATE KEY LABORATORY OF INDUSTRIAL CONTROL TECHNOLOGY   (China)

Author keywords

Capacitively coupled contactless conductivity detection C4D; data acquisition; electrical resistance tomography (ERT); phase sensitive demodulation; sensitivity field

Indexed keywords

CAPACITIVELY COUPLED CONTACTLESS CONDUCTIVITY DETECTION; CONDUCTIVITY DISTRIBUTIONS; DATA ACQUISITION SYSTEM; ELECTRICAL RESISTANCE TOMOGRAPHY; ELECTRICAL RESISTANCE TOMOGRAPHY SYSTEMS; FINITE ELEMENT METHOD MODELS; PHASE SENSITIVE DEMODULATION; SENSITIVITY FIELD;

DATA ACQUISITION; ELECTRODES; FINITE ELEMENT METHOD; LIQUIDS; SENSORS; TOMOGRAPHY;

ELECTRIC RESISTANCE;

EID: 84875992075     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2013.2246912     Document Type: Article

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