Best value design of electrical tomography systems

3rd World Congress on Industrial Process Tomography

Volumn , Issue , 2003, Pages 11-19

  Georgakopoulos, D ^a   Yang, W Q ^b   Waterfall, R C ^b  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

^b UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

Impedance measurement; Spectroscopy; System design; Tomography

Indexed keywords

DATA ACQUISITION; DELTA FUNCTIONS; DESIGN; SPECTROSCOPY; SWITCHING FUNCTIONS; SYSTEMS ANALYSIS; TOMOGRAPHY;

ANALOGUE TO DIGITALS; COMPLEX IMPEDANCE; DIFFERENT FREQUENCY; ELECTRICAL TOMOGRAPHY; FREQUENCY SWEEPING; FRONT-END CIRCUITS; IMPEDANCE MEASUREMENT; MULTIPLE FREQUENCY;

SIGNAL CONDITIONING CIRCUITS;

EID: 51349128527     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)

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