Influence of line defects on the electrical properties of single crystal TiO2

Advanced Functional Materials

Volumn 23, Issue 14, 2013, Pages 1798-1806

  Adepalli, Kiran Kumar ^a   Kelsch, Marion ^b   Merkle, Rotraut ^a   Maier, Joachim ^a  

^a MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

^b MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

charge transport; dislocations; point defects; space charge effects; structure property relationships

Indexed keywords

ELECTRICAL MEASUREMENT; HIGH OXYGEN PARTIAL PRESSURE; LOW OXYGEN PARTIAL PRESSURE; OXYGEN PARTIAL PRESSURE; SPACE CHARGE EFFECTS; STRUCTURE PROPERTY RELATIONSHIPS; TRANSMISSION ELECTRON MICROSCOPY (TEM) CHARACTERIZATIONS; VACANCY CONCENTRATION;

CHARGE CARRIERS; CHARGE TRANSFER; DEFECTS; DISLOCATIONS (CRYSTALS); ELECTRIC SPACE CHARGE; LANTHANUM COMPOUNDS; PARTIAL PRESSURE; POINT DEFECTS; SINGLE CRYSTALS; TITANIUM DIOXIDE; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRIC PROPERTIES;

EID: 84875872160     PISSN: 1616301X     EISSN: 16163028     Source Type: Journal    
DOI: 10.1002/adfm.201202256     Document Type: Article

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