Sparse imaging for fast electron microscopy

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8657, Issue , 2013, Pages

  Anderson, Hyrum S ^a   Ilic Helms, Jovana ^b   Rohrer, Brandon ^a   Wheeler, Jason ^a   Larson, Kurt ^a  

^a not available   (United States)

^b not available   (United States)

Author keywords

compressed sensing; scanning electron microscope; SEM; sparse reconstruction

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPRESSED SENSING; ELECTRONS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IMAGE RECONSTRUCTION; PROBES; SCANNING;

AROUND THE CLOCK; DATA COLLECTION; ELECTRON PROBE; IMAGE FIDELITY; NANO-METER SCALE; PIXEL LOCATION; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SPARSE RECONSTRUCTION;

SCANNING ELECTRON MICROSCOPY;

EID: 84875864057     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.2008313     Document Type: Conference Paper

References (12)

1. K. L. Briggman andW. Denk, "Towards neural circuit reconstruction with volume electron microscopy techniques," Current Opinion in Neurobiology 16, 562-570 (2006).
2. J. R. Anderson, B. W. Jones, C. B. Watt, M. V. Shaw, J.-H. Yang, D. DeMill, J. S. Lauritzen, Y. Lin, K. D. Rapp, D. Mastronarde, P. Koshevoy, B. Grimm, T. Tasdizen, R. Whitaker, and R. E. Marc, "Exploring the retinal connectome," Molecular Vision 17, 355-379 (2011).
3. K. Ogura, M. Yamada, O. Hirahara, M. Mita, N. Erdman, and C. Nielsen, "Gingantic montages with fully automated FE-SEM," Microsc. Mincroanal. 16 (Suppl 2), 52-63 (2010).
4. A. R. Shiveley, P. A. Shade, A. L. Pilchak, J. S. Tiley, and R. Kerns, "A novel method for acquiring large-scale automated scanning electron microscope data," Journal of Microscopy 244, 181-186 (2011).
5. K. J. Hayworth, N. Kasthuri, R. Schalek, and J. W. Lichtman, "Automating the collection of ultrathin serial sections for large volume TEM reconstructions," Microsc. Microanal. 12 (Suppl 2), 86-87 (2006).
6. M. Wiederspahn, "Anyalytical power for the sub-nanometer world," Imaging & Microscopy 11, 25-26 (2009).
7. B. Song, N. Xi, R. Yang, K. W. C. Lai, and C. Qu, "Video rate atomic force microscopy (AFM) imaging using compressive sensing," Proc. IEEE Conf. Nanotechnology , 1056-1056 (2011).
8. T. Hu, J. Nunez-Iglesias, S. Vitaladevuni, L. Scheffer, S. Xu, M. Bolorizadeh, H. Hess, R. Fetter, and D. Chklovskii, "Super-resolution using sparse representations over learned dictionaries: Reconstruction of brain structure using electron microscopy," arXiv preprint arXiv:1210.0564 (2012).
9. P. Binev, W. Dahmen, R. DeVore, P. Lamby, D. Savu, and R. Sharpley, Modeling Nanoscale Imaging in Electron Microscopy, ch. Compressed Sensing and Electron Microscopy, 73-126. Springer (2012).
10. T. Goldstein and S. Osher, "The split Bregman method for L1-regularized problems," SIAM Journal on Imaging Sciences 2(2), 323-343 (2009).
11. E. Candés, "The restricted isometry property and its implications for compressed sensing," Comptres rendus-Math. 346(9-10), 589-592 (2008).
12. D. Donoho, M. Elad, and V. Temlyakov, "Stable recovery of sparse overcomplete representations in the presence of noise," Information Theory, IEEE Transactions on 52(1), 6-18 (2006).