Video rate Atomic Force Microscopy (AFM) imaging using compressive sensing

Proceedings of the IEEE Conference on Nanotechnology

Volumn , Issue , 2011, Pages 1056-1059

  Song, Bo ^a   Xi, Ning ^a   Yang, Ruiguo ^a   Lai, King Wai Chiu ^a   Qu, Chengeng ^a  

^a Michigan State University   (United States)

Author keywords

AFM; Compressive Sensing; Imaging; Video Rate

Indexed keywords

AFM; ATOMIC FORCE MICROSCOPIES (AFM); COMPRESSIVE SENSING; DATA SENSING; HIGH RESOLUTION IMAGE; IMAGE RECONSTRUCTION ALGORITHM; NANO-SIZE; SAMPLE SURFACE; SCANNING TIME; SURFACE CHANGES; TOPOGRAPHY IMAGES; VIDEO RATE ATOMIC FORCE MICROSCOPIES; VIDEO RATES;

IMAGE RECONSTRUCTION; IMAGING TECHNIQUES; NANOTECHNOLOGY;

ATOMIC FORCE MICROSCOPY;

EID: 84858995951     PISSN: 19449399     EISSN: 19449380     Source Type: Conference Proceeding    
DOI: 10.1109/NANO.2011.6144587     Document Type: Conference Paper

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