Toward chromium speciation in solids using wavelength dispersive X-ray fluorescence spectrometry Cr Kβ lines

Analytica Chimica Acta

Volumn 773, Issue , 2013, Pages 37-44

  Malherbe, J ^a   Claverie, F ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Hexavalent chromium; K transition; Speciation; WD XRF

Indexed keywords

HEXAVALENT CHROMIUM; PARTIAL LEAST SQUARE REGRESSION; PHOTOELECTRON SPECTROSCOPY (XPS); PRINCIPAL COMPONENT REGRESSION; SPECIATION; WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETRIES; WAVELENGTH-DISPERSIVE X-RAY FLUORESCENCES; WD-XRF;

CHROMIUM COMPOUNDS; FLUORESCENCE SPECTROSCOPY; PHOTOELECTRON SPECTROSCOPY; PRINCIPAL COMPONENT ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY; X RAYS;

CHROMIUM;

CHROMIUM;

ACCURACY; ARTICLE; CALIBRATION; INTERMETHOD COMPARISON; OXIDATION; PARTIAL LEAST SQUARES REGRESSION; PRINCIPAL COMPONENT ANALYSIS; PRIORITY JOURNAL; SOLID STATE; SPECIES DIFFERENTIATION; SPECTROMETER; WAVELENGTH DISPERSIVE X RAY FLUORESCENCE; X RAY FLUORESCENCE; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84875823434     PISSN: 00032670     EISSN: 18734324     Source Type: Journal    
DOI: 10.1016/j.aca.2013.02.035     Document Type: Article

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