Measurement of oxidation states for transition elements with a small spot tabletop XANES instrument

X-Ray Spectrometry

Volumn 38, Issue 5, 2009, Pages 382-385

  Wei, Fuzhong ^a   Chen, Z W ^a   Gibson, W M ^a  

^a X ray Optical Systems Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTRA; X RAY ABSORPTION; X RAY ABSORPTION NEAR EDGE STRUCTURE SPECTROSCOPY;

CR 3+; HIGH SENSITIVITY; LOW POWER; LOW-COSTS; MEASUREMENTS OF; OXIDATION STATE; POWER COSTS; SMALL SPOTS; TRANSITION ELEMENT; XANES;

CHEMICAL SPECIATION;

EID: 77951730102     PISSN: 00498246     EISSN: 10974539     Source Type: Journal    
DOI: 10.1002/xrs.1185     Document Type: Article

References (9)

1. D.C. Koningsberger, R. Prins, X-rayabsorption:principles,applications, techniques of EXAFS, SEXAFS, and XANES, John Wiley and Sons: New York, 1988.
2. S. Yamashita, K. Taniguchi, S. Nomoto, T. Yamaguchi, H. Wakita, X-Ray Spectrom. 1991, 21, 91.
3. Z. W. Chen, Proc. SPIE. 1999, 3767, 114.
4. Z. W. Chen, D. B. Wittry, J. Appl. Phys. 1998, 84(2), 1064.
5. Z. W., Chen, Proceedings of 50th Denver X-ray Conference, The 2001 Denver X-ray Conference (DXC) Steamboat Springs, Colorado, USA, 2001.
6. K., Nomura, S., Doi, N., Awaji, Photon Factory Activity Report 2004 #22 Part B, 2005.
7. W. Mertz, J. Nutr. 1993, 123, 626.
8. S. De Flora, K. E. Wetterhahn, Life Chem. Rep. 1989, 7, 169.
9. D. M. Stearns, J. P. Wise Sr, S. R. Patierno, K. E. Wetterhahn, FASEB J. 1995, 9, 1664.