SCOPUS 정보 검색 플랫폼

Volumn 84, Issue 3, 2013, Pages

Note: Alignment/focus dependent core-line sensitivity for quantitative chemical analysis in hard x-ray photoelectron spectroscopy using a hemispherical electron analyzer

(5) Weiland, Conan a Browning, Raymond a Karlin, Barry A a Fischer, Daniel A a Woicik, Joseph C a

a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON ANALYZER; HARD X-RAY PHOTOELECTRON SPECTROSCOPY; IMAGING MODES; PEAK INTENSITY; QUANTITATIVE CHEMICAL ANALYSIS; RELATIVE PEAK INTENSITY;

KINETICS; PHOTOELECTRONS; SILVER;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84875790045 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.4795406 Document Type: Article

Times cited : (11)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.