Correction of non-linearity effects in detectors for electron spectroscopy

Journal of Electron Spectroscopy and Related Phenomena

Volumn 141, Issue 1, 2004, Pages 45-59

  Mannella, N ^a,b   Marchesini, S ^b,e   Kay, A W ^a,b,f   Nambu, A ^b,c   Gresch, T ^b,d   Yang, S H ^b,g   Mun, B S ^a,b   Bussat, J M ^b   Rosenhahn, A ^b,h   Fadley, C S ^a,b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF TOKYO   (Japan)

^d UNIVERSITY OF ZURICH   (Switzerland)

^e LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^f INTEL CORPORATION   (United States)

^g IBM ALMADEN RESEARCH CENTER   (United States)

^h UNIVERSITY OF HEIDELBERG   (Germany)

Author keywords

Detectors; Electron spectroscopy; Non linearity effects; Photoemission spectra

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; DETECTORS; LIGHT SOURCES; PHOTOEMISSION; SYNCHROTRON RADIATION; ULTRAHIGH VACUUM; X RAY ANALYSIS;

MICROCHANNEL PLATE (MCP); MULTIATOM RESONANT PHOTOEMISSION (MARPE); NON-LINEARITY EFFECTS; X-RAY FLUXES;

ELECTRON SPECTROSCOPY;

EID: 4644348627     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2004.03.009     Document Type: Article

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